The needle crystals, formed at high temperature annealing higher than melting point, in thin and ultrathin P(VDF-TrFE) ferroelectric films have been identified as high-performance ferroelectric elements in the films. Nanoscale piezoresponse force microscopy (PFM) imaging, spectroscopies, and lithographic writing on such individual needle crystal have clearly verified the good retention of ferroelectricity, while the non-needle surface does not. The surface coverage or areal density of such needle crystals has the same trend with the change of remenant polarization in samples, as a function of annealing temperature. Selective enrichment or separation of such needle crystals may open a novel way for high-performance devices based on P(VDF-TrFE).
Bibliographical noteFunding Information:
This work was supported by the WCU program through the National Research Foundation of Korea funded by the Ministry of Education, Science and Technology [R32-20031].
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
- Organic Chemistry
- Polymers and Plastics
- Materials Chemistry