High repair efficiency bira algorithm with a line fault scheme

Taewoo Han, Woosik Jeong, Youngkyu Park, Sungho Kang

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

With the rapid increase occurring in both the capacity and density of memory products, test and repair issues have become highly challenging. Memory repair is an effective and essential methodology for improving memory yield. An SoC utilizes builtin redundancy analysis (BIRA) with built-in self-test for improving memory yield and reliability. This letter proposes a new heuristic algorithm and new hardware architecture for the BIRA scheme. Experimental results indicate that the proposed algorithm shows near-optimal repair efficiency in combination with low area and time overheads.

Original languageEnglish
Pages (from-to)642-644
Number of pages3
JournalETRI Journal
Volume32
Issue number4
DOIs
Publication statusPublished - 2010 Aug

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

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