High-resolution temporal and spatial photoluminescence measurement of a multiple-quantum-well structure at room temperature

Honggyu An, Jaehyuk Kim, Dae Kyu Kim, Eungjang Lee, Dong Soo Shin, Hyeonjin Doh, Seung Han Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We demonstrate an experimental setup combining the near-field scanning optical microscope (NSOM) and timecorrelated single photon counting (TCSPC) system for high-resolution temporal and spatial spectroscopic measurements. In particular, a multiple-quantum-well (MQW) structure was excited with a tapered optical fiber with 100 nm opening aperture in near-field region and their temporal photoluminescence spectra were obtained by TCSPC system. We are able to measure fluorescence decay time of a GaAs/AlGaAs MQW structure with well width of 75Å in the near-field region at room temperature.

Original languageEnglish
Title of host publicationUltrafast Phenomena in Semiconductors and Nanostructure Materials XIII
DOIs
Publication statusPublished - 2009 Jun 15
EventUltrafast Phenomena in Semiconductors and Nanostructure Materials XIII - San Jose, CA, United States
Duration: 2009 Jan 252009 Jan 29

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7214
ISSN (Print)0277-786X

Other

OtherUltrafast Phenomena in Semiconductors and Nanostructure Materials XIII
CountryUnited States
CitySan Jose, CA
Period09/1/2509/1/29

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    An, H., Kim, J., Kim, D. K., Lee, E., Shin, D. S., Doh, H., & Park, S. H. (2009). High-resolution temporal and spatial photoluminescence measurement of a multiple-quantum-well structure at room temperature. In Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIII [721403] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7214). https://doi.org/10.1117/12.809966