High-speed 3D imaging using digital binary defocusing method vs sinusoidal method

Song Zhang, Jae Sang Hyun, Beiwen Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

This paper presents our research findings on high-speed 3D imaging using digital light processing (DLP) technologies. In particular, we compare two different sinusoidal fringe generation techniques using the DLP projection devices: Direct projection of 8-bit computer generated sinusoidal patterns (a.k.a, the sinusoidal method), and the creation of sinusoidal patterns by defocusing binary patterns (a.k.a., the binary defocusing method). This paper mainly examines their performance on high-accuracy measurement applications under precisely controlled settings. Two different projection systems were tested in this study: The commercially available inexpensive projector, and the DLP development kit. Experimental results demonstrated that the binary defocusing method always outperforms the sinusoidal method if a sufficient number of phase-shifted fringe patterns can be used.

Original languageEnglish
Title of host publicationEmerging Digital Micromirror Device Based Systems and Applications IX
EditorsMichael R. Douglass, Benjamin L. Lee
PublisherSPIE
ISBN (Electronic)9781510606753
DOIs
Publication statusPublished - 2017
EventEmerging Digital Micromirror Device Based Systems and Applications IX - San Francisco, United States
Duration: 2017 Jan 302017 Jan 31

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10117
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceEmerging Digital Micromirror Device Based Systems and Applications IX
Country/TerritoryUnited States
CitySan Francisco
Period17/1/3017/1/31

Bibliographical note

Funding Information:
This study was sponsored by the National Science Foundation (NSF) under grant numbers: CMMI-1150711 and CMMI-1300376. The views expressed in this chapter are those of the authors and not necessarily those of the NSF.

Publisher Copyright:
© 2017 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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