High-speed 3D imaging with three binary patterns using Hilbert transform

Jae Sang Hyun, Song Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The number of patterns used to reconstruct one 3D image is of great importance to high-speed 3D shape measurement. This paper presents a method to reduce the number of patterns by using Hilbert transform with only three binary patterns. Two fringe patterns at different frequencies and one DC component pattern are used for absolute phase retrieval. We directly applied Hilbert transform to the difference maps generated by subtracting the DC component from the fringe patterns. Then, with two-frequency phase unwrapping method using geometric constraints, the absolute phase is retrieved robustly. We designed a system to capture 2D images at 6,000 Hz, and achieved 3D geometries at 2,000 Hz. Experimental results verified the success of the proposed method.

Original languageEnglish
Title of host publicationApplied Optical Metrology III
EditorsErik Novak, James D. Trolinger
PublisherSPIE
ISBN (Electronic)9781510628977
DOIs
Publication statusPublished - 2019
EventApplied Optical Metrology III 2019 - San Diego, United States
Duration: 2019 Aug 132019 Aug 15

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11102
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Optical Metrology III 2019
Country/TerritoryUnited States
CitySan Diego
Period19/8/1319/8/15

Bibliographical note

Funding Information:
This study was sponsored by the National Science Foundation (NSF) under grant numbers III-1637961. The views expressed in this paper are those of the authors and not necessarily those of the NSF.

Publisher Copyright:
© 2019 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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