High-temperature degradation of one-dimensional metallodielectric (W/SiO2) photonic crystal as selective thermal emitter for thermophotovoltaic system

Jin Hwan Kim, Sang Min Jung, Moo Whan Shin

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In this paper, thermal stability of a one-dimensional metallodielectric photonic crystal (1D MDPhC) structure based on W and SiO2 for thermophotovoltaic systems is reported. The thermal degradation mechanism of the structure, in its operating temperature range, is thoroughly investigated by using energy dispersive spectroscopy (EDS) with transmission electron microscope (TEM) and depth-profiling X-ray photoelectron spectroscopy (XPS). It is found that the structure is entirely destroyed under 1400 K by an inter-diffusion process forming a mixture of W and SiO2 without measurable oxidization of W. But, long-term annealing results in oxidization of W layer even at a lower temperature of 1300 K. During the long-term annealing, oxygen atoms in outside atmosphere are believed to cause oxidation of the upper W layer below the top SiO2 layer. Additionally, delaminated spots are observed over the surface. These thermal behaviors are potential clues to prevent or minimize thermal degradation of the multilayer structure under high temperature operation.

Original languageEnglish
Pages (from-to)45-51
Number of pages7
JournalOptical Materials
Volume72
DOIs
Publication statusPublished - 2017 Oct

Fingerprint

Photonic crystals
emitters
Pyrolysis
thermal degradation
photonics
Annealing
degradation
High temperature operations
Degradation
Depth profiling
crystals
Energy dispersive spectroscopy
Multilayers
annealing
Thermodynamic stability
Electron microscopes
X ray photoelectron spectroscopy
Oxygen
operating temperature
Atoms

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Atomic and Molecular Physics, and Optics
  • Spectroscopy
  • Physical and Theoretical Chemistry
  • Organic Chemistry
  • Inorganic Chemistry
  • Electrical and Electronic Engineering

Cite this

@article{4401e4ffe9604bdc85b85b41165701e1,
title = "High-temperature degradation of one-dimensional metallodielectric (W/SiO2) photonic crystal as selective thermal emitter for thermophotovoltaic system",
abstract = "In this paper, thermal stability of a one-dimensional metallodielectric photonic crystal (1D MDPhC) structure based on W and SiO2 for thermophotovoltaic systems is reported. The thermal degradation mechanism of the structure, in its operating temperature range, is thoroughly investigated by using energy dispersive spectroscopy (EDS) with transmission electron microscope (TEM) and depth-profiling X-ray photoelectron spectroscopy (XPS). It is found that the structure is entirely destroyed under 1400 K by an inter-diffusion process forming a mixture of W and SiO2 without measurable oxidization of W. But, long-term annealing results in oxidization of W layer even at a lower temperature of 1300 K. During the long-term annealing, oxygen atoms in outside atmosphere are believed to cause oxidation of the upper W layer below the top SiO2 layer. Additionally, delaminated spots are observed over the surface. These thermal behaviors are potential clues to prevent or minimize thermal degradation of the multilayer structure under high temperature operation.",
author = "Kim, {Jin Hwan} and Jung, {Sang Min} and Shin, {Moo Whan}",
year = "2017",
month = "10",
doi = "10.1016/j.optmat.2017.05.041",
language = "English",
volume = "72",
pages = "45--51",
journal = "Optical Materials",
issn = "0925-3467",
publisher = "Elsevier",

}

TY - JOUR

T1 - High-temperature degradation of one-dimensional metallodielectric (W/SiO2) photonic crystal as selective thermal emitter for thermophotovoltaic system

AU - Kim, Jin Hwan

AU - Jung, Sang Min

AU - Shin, Moo Whan

PY - 2017/10

Y1 - 2017/10

N2 - In this paper, thermal stability of a one-dimensional metallodielectric photonic crystal (1D MDPhC) structure based on W and SiO2 for thermophotovoltaic systems is reported. The thermal degradation mechanism of the structure, in its operating temperature range, is thoroughly investigated by using energy dispersive spectroscopy (EDS) with transmission electron microscope (TEM) and depth-profiling X-ray photoelectron spectroscopy (XPS). It is found that the structure is entirely destroyed under 1400 K by an inter-diffusion process forming a mixture of W and SiO2 without measurable oxidization of W. But, long-term annealing results in oxidization of W layer even at a lower temperature of 1300 K. During the long-term annealing, oxygen atoms in outside atmosphere are believed to cause oxidation of the upper W layer below the top SiO2 layer. Additionally, delaminated spots are observed over the surface. These thermal behaviors are potential clues to prevent or minimize thermal degradation of the multilayer structure under high temperature operation.

AB - In this paper, thermal stability of a one-dimensional metallodielectric photonic crystal (1D MDPhC) structure based on W and SiO2 for thermophotovoltaic systems is reported. The thermal degradation mechanism of the structure, in its operating temperature range, is thoroughly investigated by using energy dispersive spectroscopy (EDS) with transmission electron microscope (TEM) and depth-profiling X-ray photoelectron spectroscopy (XPS). It is found that the structure is entirely destroyed under 1400 K by an inter-diffusion process forming a mixture of W and SiO2 without measurable oxidization of W. But, long-term annealing results in oxidization of W layer even at a lower temperature of 1300 K. During the long-term annealing, oxygen atoms in outside atmosphere are believed to cause oxidation of the upper W layer below the top SiO2 layer. Additionally, delaminated spots are observed over the surface. These thermal behaviors are potential clues to prevent or minimize thermal degradation of the multilayer structure under high temperature operation.

UR - http://www.scopus.com/inward/record.url?scp=85019688980&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85019688980&partnerID=8YFLogxK

U2 - 10.1016/j.optmat.2017.05.041

DO - 10.1016/j.optmat.2017.05.041

M3 - Article

AN - SCOPUS:85019688980

VL - 72

SP - 45

EP - 51

JO - Optical Materials

JF - Optical Materials

SN - 0925-3467

ER -