High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy

Robin W. Havener, Sang-Yong Ju, Lola Brown, Zenghui Wang, Michal Wojcik, Carlos S. Ruiz-Vargas, Jiwoong Park

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

Figure Persented: Raman spectroscopy has been used extensively to study graphene and other sp 2-bonded carbon materials, but the imaging capability of conventional micro-Raman spectroscopy is limited by the technique's low throughput. In this work, we apply an existing alternative imaging mode, widefield Raman imaging (WRI), to image and characterize graphene films on arbitrary substrates with high throughput. We show that WRI can be used to image graphene orders of magnitude faster than micro-Raman imaging allows, while still obtaining detailed spectral information about the sample. The advantages of WRI allow characterization of graphene under conditions that would be impossible or prohibitively time-consuming with other techniques, such as micro-Raman imaging or reflected optical microscopy. To demonstrate these advantages, we show that WRI enables graphene imaging on a large variety of substrates (copper, unoxidized silicon, suspended), large-scale studies of defect distribution in CVD graphene samples, and real-time imaging of dynamic processes.

Original languageEnglish
Pages (from-to)373-380
Number of pages8
JournalACS Nano
Volume6
Issue number1
DOIs
Publication statusPublished - 2012 Jan 24

Fingerprint

Graphite
Graphene
Raman spectroscopy
graphene
Throughput
Imaging techniques
Substrates
vapor deposition
microscopy
Silicon
copper
carbon
defects
Optical microscopy
silicon
Copper
Chemical vapor deposition
Carbon
Defects

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Havener, R. W., Ju, S-Y., Brown, L., Wang, Z., Wojcik, M., Ruiz-Vargas, C. S., & Park, J. (2012). High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy. ACS Nano, 6(1), 373-380. https://doi.org/10.1021/nn2037169
Havener, Robin W. ; Ju, Sang-Yong ; Brown, Lola ; Wang, Zenghui ; Wojcik, Michal ; Ruiz-Vargas, Carlos S. ; Park, Jiwoong. / High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy. In: ACS Nano. 2012 ; Vol. 6, No. 1. pp. 373-380.
@article{e34ec18f4fd941a48b579837bdd93b9b,
title = "High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy",
abstract = "Figure Persented: Raman spectroscopy has been used extensively to study graphene and other sp 2-bonded carbon materials, but the imaging capability of conventional micro-Raman spectroscopy is limited by the technique's low throughput. In this work, we apply an existing alternative imaging mode, widefield Raman imaging (WRI), to image and characterize graphene films on arbitrary substrates with high throughput. We show that WRI can be used to image graphene orders of magnitude faster than micro-Raman imaging allows, while still obtaining detailed spectral information about the sample. The advantages of WRI allow characterization of graphene under conditions that would be impossible or prohibitively time-consuming with other techniques, such as micro-Raman imaging or reflected optical microscopy. To demonstrate these advantages, we show that WRI enables graphene imaging on a large variety of substrates (copper, unoxidized silicon, suspended), large-scale studies of defect distribution in CVD graphene samples, and real-time imaging of dynamic processes.",
author = "Havener, {Robin W.} and Sang-Yong Ju and Lola Brown and Zenghui Wang and Michal Wojcik and Ruiz-Vargas, {Carlos S.} and Jiwoong Park",
year = "2012",
month = "1",
day = "24",
doi = "10.1021/nn2037169",
language = "English",
volume = "6",
pages = "373--380",
journal = "ACS Nano",
issn = "1936-0851",
publisher = "American Chemical Society",
number = "1",

}

Havener, RW, Ju, S-Y, Brown, L, Wang, Z, Wojcik, M, Ruiz-Vargas, CS & Park, J 2012, 'High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy', ACS Nano, vol. 6, no. 1, pp. 373-380. https://doi.org/10.1021/nn2037169

High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy. / Havener, Robin W.; Ju, Sang-Yong; Brown, Lola; Wang, Zenghui; Wojcik, Michal; Ruiz-Vargas, Carlos S.; Park, Jiwoong.

In: ACS Nano, Vol. 6, No. 1, 24.01.2012, p. 373-380.

Research output: Contribution to journalArticle

TY - JOUR

T1 - High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy

AU - Havener, Robin W.

AU - Ju, Sang-Yong

AU - Brown, Lola

AU - Wang, Zenghui

AU - Wojcik, Michal

AU - Ruiz-Vargas, Carlos S.

AU - Park, Jiwoong

PY - 2012/1/24

Y1 - 2012/1/24

N2 - Figure Persented: Raman spectroscopy has been used extensively to study graphene and other sp 2-bonded carbon materials, but the imaging capability of conventional micro-Raman spectroscopy is limited by the technique's low throughput. In this work, we apply an existing alternative imaging mode, widefield Raman imaging (WRI), to image and characterize graphene films on arbitrary substrates with high throughput. We show that WRI can be used to image graphene orders of magnitude faster than micro-Raman imaging allows, while still obtaining detailed spectral information about the sample. The advantages of WRI allow characterization of graphene under conditions that would be impossible or prohibitively time-consuming with other techniques, such as micro-Raman imaging or reflected optical microscopy. To demonstrate these advantages, we show that WRI enables graphene imaging on a large variety of substrates (copper, unoxidized silicon, suspended), large-scale studies of defect distribution in CVD graphene samples, and real-time imaging of dynamic processes.

AB - Figure Persented: Raman spectroscopy has been used extensively to study graphene and other sp 2-bonded carbon materials, but the imaging capability of conventional micro-Raman spectroscopy is limited by the technique's low throughput. In this work, we apply an existing alternative imaging mode, widefield Raman imaging (WRI), to image and characterize graphene films on arbitrary substrates with high throughput. We show that WRI can be used to image graphene orders of magnitude faster than micro-Raman imaging allows, while still obtaining detailed spectral information about the sample. The advantages of WRI allow characterization of graphene under conditions that would be impossible or prohibitively time-consuming with other techniques, such as micro-Raman imaging or reflected optical microscopy. To demonstrate these advantages, we show that WRI enables graphene imaging on a large variety of substrates (copper, unoxidized silicon, suspended), large-scale studies of defect distribution in CVD graphene samples, and real-time imaging of dynamic processes.

UR - http://www.scopus.com/inward/record.url?scp=84856147946&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84856147946&partnerID=8YFLogxK

U2 - 10.1021/nn2037169

DO - 10.1021/nn2037169

M3 - Article

VL - 6

SP - 373

EP - 380

JO - ACS Nano

JF - ACS Nano

SN - 1936-0851

IS - 1

ER -