Highly enhanced mechanical stability of indium tin oxide film with a thin Al buffer layer deposited on plastic substrate

Boyeon Sim, Eun He Kim, Jinwoo Park, Myeongkyu Lee

Research output: Contribution to journalArticle

27 Citations (Scopus)


We here report that the mechanical stability of indium tin oxide (ITO) film deposited on the plastic substrate can be highly enhanced by a thin metal buffer layer with a minimized loss of transparency. Neither cracks nor fragmentation was observed for a 75 nm-thick ITO film with a 5 nm-Al layer even after severe bending to a radius of curvature of 1.25 mm, while a 160 nm-ITO film of similar surface resistance was cracked at 9 mm. The improved crack resistance is accounted for by the fact that the effective elastic mismatch between the film and the substrate can be alleviated with a ductile buffer layer, thus the crack propagation is suppressed.

Original languageEnglish
Pages (from-to)309-312
Number of pages4
JournalSurface and Coatings Technology
Issue number3
Publication statusPublished - 2009 Oct 25


All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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