Highly Reliable Amorphous In-Ga-Zn-O Thin-Film Transistors Through the Addition of Nitrogen Doping

Kyung Park, Jong Heon Kim, Taehoon Sung, Hyun Woo Park, Ju Heyuck Baeck, Jonguk Bae, Kwon Shik Park, Sooyoung Yoon, Inbyeong Kang, Kwun Bum Chung, Hyun Suk Kim, Jang Yeon Kwon

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Engineering & Materials Science