Abstract
Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based method requires a large volume of data and a long test duration, especially for a high resolution ADC. A fast and accurate calibration method for pipelined ADCs is proposed in this research. The proposed calibration method composes histograms through the outputs of each stage and calculates error sources. The digitized outputs of a stage are influenced directly by the operation of the prior stage, so the results of the histogram provide the information of errors in the prior stage. The composed histograms reduce the required samples and thus calibration time being implemented by simple modules. For 14-bit resolution pipelined ADC, the measured maximum integral non-linearity (INL) is improved from 6.78 to 0.52 LSB, and the spurious-free dynamic range (SFDR) and signal-to-noise-and-distortion ratio (SNDR) are improved from 67.0 to 106.2dB and from 65.6 to 84.8dB, respectively.
| Original language | English |
|---|---|
| Article number | e0129736 |
| Journal | PloS one |
| Volume | 10 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2015 Jun 12 |
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All Science Journal Classification (ASJC) codes
- Biochemistry, Genetics and Molecular Biology(all)
- Agricultural and Biological Sciences(all)
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Histogram-based calibration method for pipeline ADCs. / Son, Hyeonuk; Jang, Jaewon; Kim, Heetae; Kang, Sungho.
In: PloS one, Vol. 10, No. 6, e0129736, 12.06.2015.Research output: Contribution to journal › Article
TY - JOUR
T1 - Histogram-based calibration method for pipeline ADCs
AU - Son, Hyeonuk
AU - Jang, Jaewon
AU - Kim, Heetae
AU - Kang, Sungho
PY - 2015/6/12
Y1 - 2015/6/12
N2 - Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based method requires a large volume of data and a long test duration, especially for a high resolution ADC. A fast and accurate calibration method for pipelined ADCs is proposed in this research. The proposed calibration method composes histograms through the outputs of each stage and calculates error sources. The digitized outputs of a stage are influenced directly by the operation of the prior stage, so the results of the histogram provide the information of errors in the prior stage. The composed histograms reduce the required samples and thus calibration time being implemented by simple modules. For 14-bit resolution pipelined ADC, the measured maximum integral non-linearity (INL) is improved from 6.78 to 0.52 LSB, and the spurious-free dynamic range (SFDR) and signal-to-noise-and-distortion ratio (SNDR) are improved from 67.0 to 106.2dB and from 65.6 to 84.8dB, respectively.
AB - Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based method requires a large volume of data and a long test duration, especially for a high resolution ADC. A fast and accurate calibration method for pipelined ADCs is proposed in this research. The proposed calibration method composes histograms through the outputs of each stage and calculates error sources. The digitized outputs of a stage are influenced directly by the operation of the prior stage, so the results of the histogram provide the information of errors in the prior stage. The composed histograms reduce the required samples and thus calibration time being implemented by simple modules. For 14-bit resolution pipelined ADC, the measured maximum integral non-linearity (INL) is improved from 6.78 to 0.52 LSB, and the spurious-free dynamic range (SFDR) and signal-to-noise-and-distortion ratio (SNDR) are improved from 67.0 to 106.2dB and from 65.6 to 84.8dB, respectively.
UR - http://www.scopus.com/inward/record.url?scp=84935465566&partnerID=8YFLogxK
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U2 - 10.1371/journal.pone.0129736
DO - 10.1371/journal.pone.0129736
M3 - Article
C2 - 26070196
AN - SCOPUS:84935465566
VL - 10
JO - PLoS One
JF - PLoS One
SN - 1932-6203
IS - 6
M1 - e0129736
ER -