This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).
|Number of pages||7|
|Publication status||Published - 2012 Oct 30|
|Event||13th International Conference on Ferroelectric Liquid Crystals - Niagara Falls, ON, Canada|
Duration: 2012 Aug 28 → 2012 Sep 2
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics