Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation

Lee Gon Kim, Seok Yang, Young Gu Kang, Hong Gyu Park, Jin Woo Lee, Dae-Shik Seo

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).

Original languageEnglish
Pages (from-to)176-182
Number of pages7
JournalFerroelectrics
Volume431
Issue number1
DOIs
Publication statusPublished - 2012 Oct 30
Event13th International Conference on Ferroelectric Liquid Crystals - Niagara Falls, ON, Canada
Duration: 2012 Aug 282012 Sep 2

Fingerprint

Liquid Crystals
Liquid crystals
Ion beams
ion beams
liquid crystals
alignment
Irradiation
Van der Waals forces
irradiation
Photoelectrons
photoelectrons
X rays
Spectroscopic analysis
spectroscopic analysis
dioxides
Zirconium
Magnetron sputtering
Contact angle
radio frequencies
magnetron sputtering

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kim, Lee Gon ; Yang, Seok ; Kang, Young Gu ; Park, Hong Gyu ; Lee, Jin Woo ; Seo, Dae-Shik. / Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation. In: Ferroelectrics. 2012 ; Vol. 431, No. 1. pp. 176-182.
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abstract = "This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).",
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Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation. / Kim, Lee Gon; Yang, Seok; Kang, Young Gu; Park, Hong Gyu; Lee, Jin Woo; Seo, Dae-Shik.

In: Ferroelectrics, Vol. 431, No. 1, 30.10.2012, p. 176-182.

Research output: Contribution to journalConference article

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T1 - Homogeneously aligned liquid crystals on a ZrO2 alignment film using ion-beam irradiation

AU - Kim, Lee Gon

AU - Yang, Seok

AU - Kang, Young Gu

AU - Park, Hong Gyu

AU - Lee, Jin Woo

AU - Seo, Dae-Shik

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AB - This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM).

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