Hydroxyl radical-assisted decomposition and oxidation in solution-processed indium oxide thin-film transistors

Mardhiah M. Sabri, Joohye Jung, Doo Hyun Yoon, Seokhyun Yoon, Young Jun Tak, Hyun Jae Kim

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Solution-processed indium oxide TFTs were fabricated by hydroxyl radical-assisted (HRA) decomposition and oxidation. The results show that decomposition and oxidation of carbon is more substantial than metal hydroxides, leading to the elimination of organic residues, correlated to a low interface trap density (S.S. = 0.45 V dec-1, NT = 1.11 × 1012 cm-2) in the device. The resultant HRA indium oxide TFTs exhibit improved electrical characteristics such as the mobility, the on/off current ratio, and the subthreshold swing as well as bias stabilities under PBS and NBS conditions.

Original languageEnglish
Pages (from-to)7499-7505
Number of pages7
JournalJournal of Materials Chemistry C
Volume3
Issue number28
DOIs
Publication statusPublished - 2015 Jul 28

Fingerprint

Thin film transistors
Hydroxyl Radical
Indium
Oxide films
Hydroxides
Decomposition
Oxidation
Oxides
Carbon
Metals
indium oxide
methylarginyl-lysyl-prolyl-tryptophyl-tert-leucyl-leucyl-ethyl ester

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Chemistry

Cite this

Sabri, Mardhiah M. ; Jung, Joohye ; Yoon, Doo Hyun ; Yoon, Seokhyun ; Tak, Young Jun ; Kim, Hyun Jae. / Hydroxyl radical-assisted decomposition and oxidation in solution-processed indium oxide thin-film transistors. In: Journal of Materials Chemistry C. 2015 ; Vol. 3, No. 28. pp. 7499-7505.
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Hydroxyl radical-assisted decomposition and oxidation in solution-processed indium oxide thin-film transistors. / Sabri, Mardhiah M.; Jung, Joohye; Yoon, Doo Hyun; Yoon, Seokhyun; Tak, Young Jun; Kim, Hyun Jae.

In: Journal of Materials Chemistry C, Vol. 3, No. 28, 28.07.2015, p. 7499-7505.

Research output: Contribution to journalArticle

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