Abstract
This study formulates the following relationship for identifying randomly interstratified illite/smectite using the integrated peak widths (β) for the first-order reflections after ethylene-glycolation (EG) and thermal dehydration (TD) treatments: Pi = βEG - 0.589ΒTD/1.324βTD - 3.911 where pi is the proportion of interstratified illite layers. The relationship minimizes the effect of crystallite thickness on the evaluation of pi, which has been a critical source of error in the previous methods using peak position and intensity.
| Original language | English |
|---|---|
| Pages (from-to) | 1478-1480 |
| Number of pages | 3 |
| Journal | American Mineralogist |
| Volume | 93 |
| Issue number | 8-9 |
| DOIs | |
| Publication status | Published - 2008 Aug 1 |
All Science Journal Classification (ASJC) codes
- Geophysics
- Geochemistry and Petrology
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Kang, I. M., Kim, M. H., Song, Y., & Moon, H. S. (2008). Identification of randomly interstratified illite/smectite with basal peak widths. American Mineralogist, 93(8-9), 1478-1480. https://doi.org/10.2138/am.2008.2970