Identification of randomly interstratified illite/smectite with basal peak widths

Il Mo Kang; Myung Hun Kim; Yungoo Song; Hi Soo Moon

doi:10.2138/am.2008.2970

Identification of randomly interstratified illite/smectite with basal peak widths

Il Mo Kang, Myung Hun Kim, Yungoo Song, Hi Soo Moon

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

This study formulates the following relationship for identifying randomly interstratified illite/smectite using the integrated peak widths (β) for the first-order reflections after ethylene-glycolation (EG) and thermal dehydration (TD) treatments: Pi = β_EG - 0.589Β_TD/1.324β_TD - 3.911 where pi is the proportion of interstratified illite layers. The relationship minimizes the effect of crystallite thickness on the evaluation of pi, which has been a critical source of error in the previous methods using peak position and intensity.

Original language	English
Pages (from-to)	1478-1480
Number of pages	3
Journal	American Mineralogist
Volume	93
Issue number	8-9
DOIs	https://doi.org/10.2138/am.2008.2970
Publication status	Published - 2008 Aug

All Science Journal Classification (ASJC) codes

Geophysics
Geochemistry and Petrology

Access to Document

10.2138/am.2008.2970

Fingerprint Dive into the research topics of 'Identification of randomly interstratified illite/smectite with basal peak widths'. Together they form a unique fingerprint.

Cite this

@article{7a523490226f4b248754aa5255425650,

title = "Identification of randomly interstratified illite/smectite with basal peak widths",

abstract = "This study formulates the following relationship for identifying randomly interstratified illite/smectite using the integrated peak widths (β) for the first-order reflections after ethylene-glycolation (EG) and thermal dehydration (TD) treatments: Pi = βEG - 0.589ΒTD/1.324βTD - 3.911 where pi is the proportion of interstratified illite layers. The relationship minimizes the effect of crystallite thickness on the evaluation of pi, which has been a critical source of error in the previous methods using peak position and intensity.",

author = "Kang, {Il Mo} and Kim, {Myung Hun} and Yungoo Song and Moon, {Hi Soo}",

year = "2008",

month = aug,

doi = "10.2138/am.2008.2970",

language = "English",

volume = "93",

pages = "1478--1480",

journal = "American Mineralogist",

issn = "0003-004X",

publisher = "Mineralogical Society of America",

number = "8-9",

}

TY - JOUR

T1 - Identification of randomly interstratified illite/smectite with basal peak widths

AU - Kang, Il Mo

AU - Kim, Myung Hun

AU - Song, Yungoo

AU - Moon, Hi Soo

PY - 2008/8

Y1 - 2008/8

N2 - This study formulates the following relationship for identifying randomly interstratified illite/smectite using the integrated peak widths (β) for the first-order reflections after ethylene-glycolation (EG) and thermal dehydration (TD) treatments: Pi = βEG - 0.589ΒTD/1.324βTD - 3.911 where pi is the proportion of interstratified illite layers. The relationship minimizes the effect of crystallite thickness on the evaluation of pi, which has been a critical source of error in the previous methods using peak position and intensity.

AB - This study formulates the following relationship for identifying randomly interstratified illite/smectite using the integrated peak widths (β) for the first-order reflections after ethylene-glycolation (EG) and thermal dehydration (TD) treatments: Pi = βEG - 0.589ΒTD/1.324βTD - 3.911 where pi is the proportion of interstratified illite layers. The relationship minimizes the effect of crystallite thickness on the evaluation of pi, which has been a critical source of error in the previous methods using peak position and intensity.

UR - http://www.scopus.com/inward/record.url?scp=50849138192&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=50849138192&partnerID=8YFLogxK

U2 - 10.2138/am.2008.2970

DO - 10.2138/am.2008.2970

M3 - Article

AN - SCOPUS:50849138192

VL - 93

SP - 1478

EP - 1480

JO - American Mineralogist

JF - American Mineralogist

SN - 0003-004X

IS - 8-9

ER -