Identifying defects in nanoscale materials

Masa Ishigami, Hyoung Joon Choi, Shaul Aloni, Steven G. Louie, Marvin L. Cohen, A. Zettl

Research output: Contribution to journalArticle

64 Citations (Scopus)

Abstract

An iterative experimental-theoretical technique was developed for the identification of defects in nanoscale materials. The atomic structure of defects were analyzed using scanning tunneling microscopy and spectroscopy. The defects, which were responsible for the electronic properties of carbon nanotube intramolecular junction, were also identified using the method. THe method was also to solve problems such as, the influence of defects on transport, exciton lifetimes in quantum dots, and mechanical properties of nanotubes, nanowires, and nanocrystals.

Original languageEnglish
Pages (from-to)196803-1-196803-4
JournalPhysical Review Letters
Volume93
Issue number19
DOIs
Publication statusPublished - 2004 Nov 5

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defects
atomic structure
scanning tunneling microscopy
nanotubes
nanocrystals
nanowires
carbon nanotubes
quantum dots
excitons
mechanical properties
life (durability)
electronics
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Ishigami, M., Choi, H. J., Aloni, S., Louie, S. G., Cohen, M. L., & Zettl, A. (2004). Identifying defects in nanoscale materials. Physical Review Letters, 93(19), 196803-1-196803-4. https://doi.org/10.1103/PhysRevLett.93.196803
Ishigami, Masa ; Choi, Hyoung Joon ; Aloni, Shaul ; Louie, Steven G. ; Cohen, Marvin L. ; Zettl, A. / Identifying defects in nanoscale materials. In: Physical Review Letters. 2004 ; Vol. 93, No. 19. pp. 196803-1-196803-4.
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Ishigami, M, Choi, HJ, Aloni, S, Louie, SG, Cohen, ML & Zettl, A 2004, 'Identifying defects in nanoscale materials', Physical Review Letters, vol. 93, no. 19, pp. 196803-1-196803-4. https://doi.org/10.1103/PhysRevLett.93.196803

Identifying defects in nanoscale materials. / Ishigami, Masa; Choi, Hyoung Joon; Aloni, Shaul; Louie, Steven G.; Cohen, Marvin L.; Zettl, A.

In: Physical Review Letters, Vol. 93, No. 19, 05.11.2004, p. 196803-1-196803-4.

Research output: Contribution to journalArticle

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Ishigami M, Choi HJ, Aloni S, Louie SG, Cohen ML, Zettl A. Identifying defects in nanoscale materials. Physical Review Letters. 2004 Nov 5;93(19):196803-1-196803-4. https://doi.org/10.1103/PhysRevLett.93.196803