Identifying defects in nanoscale materials

Masa Ishigami, Hyoung Joon Choi, Shaul Aloni, Steven G. Louie, Marvin L. Cohen, A. Zettl

Research output: Contribution to journalArticle

64 Citations (Scopus)

Abstract

An iterative experimental-theoretical technique was developed for the identification of defects in nanoscale materials. The atomic structure of defects were analyzed using scanning tunneling microscopy and spectroscopy. The defects, which were responsible for the electronic properties of carbon nanotube intramolecular junction, were also identified using the method. THe method was also to solve problems such as, the influence of defects on transport, exciton lifetimes in quantum dots, and mechanical properties of nanotubes, nanowires, and nanocrystals.

Original languageEnglish
Article number196803
Pages (from-to)196803-1-196803-4
JournalPhysical review letters
Volume93
Issue number19
DOIs
Publication statusPublished - 2004 Nov 5

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Identifying defects in nanoscale materials'. Together they form a unique fingerprint.

  • Cite this

    Ishigami, M., Choi, H. J., Aloni, S., Louie, S. G., Cohen, M. L., & Zettl, A. (2004). Identifying defects in nanoscale materials. Physical review letters, 93(19), 196803-1-196803-4. [196803]. https://doi.org/10.1103/PhysRevLett.93.196803