@inproceedings{06712b208d1d4e67b47dfd4f3a8d58de,
title = "Identity of the conducting nano-filaments in TiO2 and the resistance switching mechanism of TiO2/NiO stacked layers",
abstract = "The resistance switching (RS) behaviors of TiO2 and TiO 2/NiO thin films were examined. The presence of conductive nanofilaments was confirmed directly by high-resolution transmission electron microscopy (HRTEM) in a Pt/TiO2/Pt system. The HRTEM images identified Magn{\'e}li structured filaments (mostly Ti4O 7 phase) of both set and reset states. The local electrical properties were confirmed by in-situ current-voltage measurements in HRTEM. The in-situ HRTEM observation confirmed the structural change of the filament during set and reset switching. The RS behaviour of a stacked material composed of n-type TiO2 and p-type NiO was also examined. The switching time could be decreased by ∼1,000 times compared to the single layer material by stacking the two layers.",
author = "Kim, {Kyung Min} and Kwon, {Deok Hwang} and Jang, {Jae Hyuck} and Lee, {Min Hwan} and Song, {Seul Jie} and Kim, {Gun Hwan} and Seok, {Jun Yeong} and Bora Lee and Seungwu Han and Miyoung Kim and Hwang, {Cheol Seong}",
year = "2010",
doi = "10.1149/1.3481616",
language = "English",
isbn = "9781566778220",
series = "ECS Transactions",
publisher = "Electrochemical Society Inc.",
number = "3",
pages = "291--298",
booktitle = "Physics and Technology of High-k Materials 8",
edition = "3",
}