Improved edge-adaptive demosaicking method for artifact suppression around line edges

Lee Jonghwa, Jeong Taeuk, Lee Chulhee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper, we present an edge-adaptive demosaicking method with artifact suppression. Although various demosaicking methods have been proposed, they still suffer from artifacts around line edges. In order to suppress such undesirable artifacts around line edges, the proposed method first determines line edge patterns and interpolates missing pixels along detected directions. Then, refinement and calibration processes are carried out in series to improve the quality of reconstructed images. Experimental results demonstrate that the proposed method produces visually pleasing images and outperforms existing demosaicking methods in terms of peak signal-to-noise ratio (PSNR).

Original languageEnglish
Title of host publicationDigest of Technical Papers - 2007 International Conference on Consumer Electronics, ICCE 2007
DOIs
Publication statusPublished - 2007 Aug 24
Event2007 Digest of Technical Papers International Conference on Consumer Electronics - Las Vegas, NV, United States
Duration: 2007 Jan 102007 Jan 14

Other

Other2007 Digest of Technical Papers International Conference on Consumer Electronics
CountryUnited States
CityLas Vegas, NV
Period07/1/1007/1/14

Fingerprint

Signal to noise ratio
Pixels
Calibration

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Jonghwa, L., Taeuk, J., & Chulhee, L. (2007). Improved edge-adaptive demosaicking method for artifact suppression around line edges. In Digest of Technical Papers - 2007 International Conference on Consumer Electronics, ICCE 2007 [4146230] https://doi.org/10.1109/ICCE.2007.341341
Jonghwa, Lee ; Taeuk, Jeong ; Chulhee, Lee. / Improved edge-adaptive demosaicking method for artifact suppression around line edges. Digest of Technical Papers - 2007 International Conference on Consumer Electronics, ICCE 2007. 2007.
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Jonghwa, L, Taeuk, J & Chulhee, L 2007, Improved edge-adaptive demosaicking method for artifact suppression around line edges. in Digest of Technical Papers - 2007 International Conference on Consumer Electronics, ICCE 2007., 4146230, 2007 Digest of Technical Papers International Conference on Consumer Electronics, Las Vegas, NV, United States, 07/1/10. https://doi.org/10.1109/ICCE.2007.341341

Improved edge-adaptive demosaicking method for artifact suppression around line edges. / Jonghwa, Lee; Taeuk, Jeong; Chulhee, Lee.

Digest of Technical Papers - 2007 International Conference on Consumer Electronics, ICCE 2007. 2007. 4146230.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Jonghwa L, Taeuk J, Chulhee L. Improved edge-adaptive demosaicking method for artifact suppression around line edges. In Digest of Technical Papers - 2007 International Conference on Consumer Electronics, ICCE 2007. 2007. 4146230 https://doi.org/10.1109/ICCE.2007.341341