Improved panchromatic sharpening

Jonghwa Lee, Sangwook Lee, Chulhee Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a new panchromatic sharpening method based on quality parameter optimization. Traditionally, quality metrics such as UIQI, CORR, and ERGAS have been used to assess the quality of panchromatic sharpening. Generally, HPF (high pass filtering) based panchromatic sharpening methods produce good performance. However, one problem with these methods is the peak noise that arises due to a small denominator value when the mean shift problem is addressed. In order to address this problem, we introduce an offset value that was optimized based on a quality metric. We assumed that the offset value was invariant with respect to the spatial scale, and it was used to enhance the resolution of the original multispectral images by using a high-resolution panchromatic image. The experimental results demonstrate that the proposed method showed better performance than some existing panchromatic sharpening methods.

Original languageEnglish
Title of host publicationSatellite Data Compression, Communications, and Processing VI
DOIs
Publication statusPublished - 2010 Oct 18
EventSatellite Data Compression, Communications, and Processing VI - San Diego, CA, United States
Duration: 2010 Aug 32010 Aug 5

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7810
ISSN (Print)0277-786X

Other

OtherSatellite Data Compression, Communications, and Processing VI
CountryUnited States
CitySan Diego, CA
Period10/8/310/8/5

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Lee, J., Lee, S., & Lee, C. (2010). Improved panchromatic sharpening. In Satellite Data Compression, Communications, and Processing VI [78100T] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7810). https://doi.org/10.1117/12.862243