Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer

J. H. Kang, D. W. Kim, J. H. Kim, Y. S. Lim, M. H. Lee, W. S. Seo, H. J. Choi, K. H. Seo, M. G. Park

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Abstract

A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.

Original languageEnglish
Pages (from-to)6840-6843
Number of pages4
JournalThin Solid Films
Volume519
Issue number20
DOIs
Publication statusPublished - 2011 Aug 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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    Kang, J. H., Kim, D. W., Kim, J. H., Lim, Y. S., Lee, M. H., Seo, W. S., Choi, H. J., Seo, K. H., & Park, M. G. (2011). Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer. Thin Solid Films, 519(20), 6840-6843. https://doi.org/10.1016/j.tsf.2011.01.211