Abstract
A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.
| Original language | English |
|---|---|
| Pages (from-to) | 6840-6843 |
| Number of pages | 4 |
| Journal | Thin Solid Films |
| Volume | 519 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 2011 Aug 1 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
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Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer. / Kang, J. H.; Kim, D. W.; Kim, J. H.; Lim, Y. S.; Lee, M. H.; Seo, W. S.; Choi, H. J.; Seo, K. H.; Park, M. G.
In: Thin Solid Films, Vol. 519, No. 20, 01.08.2011, p. 6840-6843.Research output: Contribution to journal › Article
TY - JOUR
T1 - Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer
AU - Kang, J. H.
AU - Kim, D. W.
AU - Kim, J. H.
AU - Lim, Y. S.
AU - Lee, M. H.
AU - Seo, W. S.
AU - Choi, H. J.
AU - Seo, K. H.
AU - Park, M. G.
PY - 2011/8/1
Y1 - 2011/8/1
N2 - A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.
AB - A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.
UR - http://www.scopus.com/inward/record.url?scp=80051544896&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=80051544896&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2011.01.211
DO - 10.1016/j.tsf.2011.01.211
M3 - Article
AN - SCOPUS:80051544896
VL - 519
SP - 6840
EP - 6843
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 20
ER -