Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer

J. H. Kang; D. W. Kim; J. H. Kim; Y. S. Lim; M. H. Lee; W. S. Seo; H. J. Choi; K. H. Seo; M. G. Park

doi:10.1016/j.tsf.2011.01.211

Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer

J. H. Kang, D. W. Kim, J. H. Kim, Y. S. Lim, M. H. Lee, W. S. Seo, H. J. Choi, K. H. Seo, M. G. Park

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.

Original language	English
Pages (from-to)	6840-6843
Number of pages	4
Journal	Thin Solid Films
Volume	519
Issue number	20
DOIs	https://doi.org/10.1016/j.tsf.2011.01.211
Publication status	Published - 2011 Aug 1

Bibliographical note

Funding Information:
This work was supported by a Grant-in-Aid for R&D Programs (No. 10029940 ) from the Korean Ministry of Knowledge Economy .

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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title = "Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer",

abstract = "A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.",

author = "Kang, {J. H.} and Kim, {D. W.} and Kim, {J. H.} and Lim, {Y. S.} and Lee, {M. H.} and Seo, {W. S.} and Choi, {H. J.} and Seo, {K. H.} and Park, {M. G.}",

note = "Funding Information: This work was supported by a Grant-in-Aid for R&D Programs (No. 10029940 ) from the Korean Ministry of Knowledge Economy .",

year = "2011",

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doi = "10.1016/j.tsf.2011.01.211",

language = "English",

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journal = "Thin Solid Films",

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T1 - Improved thermal stability of ZnO transparent conducting films with a ZnO overlayer

AU - Kang, J. H.

AU - Kim, D. W.

AU - Kim, J. H.

AU - Lim, Y. S.

AU - Lee, M. H.

AU - Seo, W. S.

AU - Choi, H. J.

AU - Seo, K. H.

AU - Park, M. G.

N1 - Funding Information: This work was supported by a Grant-in-Aid for R&D Programs (No. 10029940 ) from the Korean Ministry of Knowledge Economy .

PY - 2011/8/1

Y1 - 2011/8/1

N2 - A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.

AB - A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.

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