In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe2 O4 thin film grown on a piezoelectric substrate

Jung H. Park, Jung Hoon Lee, Min G. Kim, Young Kyu Jeong, Min Ae Oak, Hyun Myung Jang, Hyoung Joon Choi, James F. Scott

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

Strain engineering of the magnetic property is an important subject in the study of multiferroic materials. Here we propose a multiferroic bilayer structure in which the magnetic remanence is controlled by the in-plane strain of the top CFO (CoFe2 O4) layer epitaxially constrained by the bottom Pb (Mg1/3 Nb2/3) O3 -PbTiO 3 piezoelectric substrate. We have shown that the room-temperature magnetic remanence (MR) of the 100-nm-thick CFO layer is enhanced by 35.4% when an electric field of 10 kV/cm is applied. The MR value of our bilayer structure was shown to be linearly proportional to the magnitude of the in-plane compressive strain which, in turn, was proportional to the applied field strength. Synchrotron x-ray absorption near-edge structure study supports a scenario of the cation-charge redistribution between Co2+ and Fe 3+ ions under the condition of an electric-field-induced in-plane compressive strain.

Original languageEnglish
Article number134401
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume81
Issue number13
DOIs
Publication statusPublished - 2010 Apr 1

Fingerprint

Strain control
Remanence
plane strain
remanence
Cations
Positive ions
cations
Thin films
Substrates
thin films
Electric fields
electric fields
Synchrotrons
x ray absorption
field strength
Magnetic properties
synchrotrons
engineering
Ions
magnetic properties

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Park, Jung H. ; Lee, Jung Hoon ; Kim, Min G. ; Jeong, Young Kyu ; Oak, Min Ae ; Jang, Hyun Myung ; Choi, Hyoung Joon ; Scott, James F. / In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe2 O4 thin film grown on a piezoelectric substrate. In: Physical Review B - Condensed Matter and Materials Physics. 2010 ; Vol. 81, No. 13.
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In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe2 O4 thin film grown on a piezoelectric substrate. / Park, Jung H.; Lee, Jung Hoon; Kim, Min G.; Jeong, Young Kyu; Oak, Min Ae; Jang, Hyun Myung; Choi, Hyoung Joon; Scott, James F.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 81, No. 13, 134401, 01.04.2010.

Research output: Contribution to journalArticle

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AU - Jeong, Young Kyu

AU - Oak, Min Ae

AU - Jang, Hyun Myung

AU - Choi, Hyoung Joon

AU - Scott, James F.

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