In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe2 O4 thin film grown on a piezoelectric substrate

Jung H. Park, Jung Hoon Lee, Min G. Kim, Young Kyu Jeong, Min Ae Oak, Hyun Myung Jang, Hyoung Joon Choi, James F. Scott

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

Strain engineering of the magnetic property is an important subject in the study of multiferroic materials. Here we propose a multiferroic bilayer structure in which the magnetic remanence is controlled by the in-plane strain of the top CFO (CoFe2 O4) layer epitaxially constrained by the bottom Pb (Mg1/3 Nb2/3) O3 -PbTiO 3 piezoelectric substrate. We have shown that the room-temperature magnetic remanence (MR) of the 100-nm-thick CFO layer is enhanced by 35.4% when an electric field of 10 kV/cm is applied. The MR value of our bilayer structure was shown to be linearly proportional to the magnitude of the in-plane compressive strain which, in turn, was proportional to the applied field strength. Synchrotron x-ray absorption near-edge structure study supports a scenario of the cation-charge redistribution between Co2+ and Fe 3+ ions under the condition of an electric-field-induced in-plane compressive strain.

Original languageEnglish
Article number134401
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume81
Issue number13
DOIs
Publication statusPublished - 2010 Apr 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'In-plane strain control of the magnetic remanence and cation-charge redistribution in CoFe<sub>2</sub> O<sub>4</sub> thin film grown on a piezoelectric substrate'. Together they form a unique fingerprint.

  • Cite this