In-situ dynamic high-resolution transmission electron microscopy

application to Pt/GaAs interfacial reactions

Dae Hong Ko, Robert Sinclair

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

In-situ annealing high-resolution transmission electron microscopy (HRTEM) is a powerful technique for the observation of dynamic events in materials at the atomic scale. This paper discusses its use, and applies it to the study of the interfacial reactions in the Pt/GaAs system. We observed that initially a solid-state amorphization process occurs, by the dominant diffusion of Pt to the GaAs. The correlation of the kinetic data with the microstructural changes reveals that the diffusion kinetics are changed after the transformation of the amorphous phase to a crystalline product. During the high-temperature reaction which produces crystalline platinum gallide and platinum di-arsenide, we observed that GaAs substrate is dissociated in a layer-by-layer manner via a ledge mechanism. The whole reaction process and kinetic data are consistent with those of parallel ex-situ annealing experiments.

Original languageEnglish
Pages (from-to)166-178
Number of pages13
JournalUltramicroscopy
Volume54
Issue number2-4
DOIs
Publication statusPublished - 1994 Jan 1

Fingerprint

High resolution transmission electron microscopy
Surface chemistry
Platinum
transmission electron microscopy
Kinetics
high resolution
kinetics
platinum
Annealing
Crystalline materials
ledges
annealing
Amorphization
solid state
Substrates
products
gallium arsenide
Experiments
Temperature

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

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In-situ dynamic high-resolution transmission electron microscopy : application to Pt/GaAs interfacial reactions. / Ko, Dae Hong; Sinclair, Robert.

In: Ultramicroscopy, Vol. 54, No. 2-4, 01.01.1994, p. 166-178.

Research output: Contribution to journalArticle

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