Influence of electrode modification by Ar+ ion beam upon passivation and electrical characteristics in organic light-emitting diodes

Soon Moon Jeong, Won Hoi Koo, Sang Hun Choi, Sung Jin Jo, Hong Koo Baik, Se Jong Lee, Kie Moon Song

Research output: Contribution to journalArticle


Ion-beam-assisted deposition (IBAD) was used for cathode preparation in organic light-emitting diodes to fabricate dense electrode. Dark spot growth rate was decreased by employing the IBAD process due to a highly packed aluminum structure inhibiting the permeation of H2O and O2. However, undesirable leakage current was generated because energetic particles of Al assisted by Ar+ ion may damage the organic material resulting in reduction of contact resistance. The decrease of contact resistance in the IBAD device may be caused by large contact area, increase of density of states, and Li diffusion to phenyl-substituted poly-p- phenylene vinylene.

Original languageEnglish
Pages (from-to)81-92
Number of pages12
JournalJournal of Materials Research
Issue number1
Publication statusPublished - 2005 Jan 1


All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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