Influence of Pinhole-Type Defects in AlGaN on rf Performance of AlGaN/GaN HFETs Grown by MOCVD

Jong Wook Kim, Jae Seung Lee, Jin H.O. Shin, Jae Hoon Lee, Sung H.O. Hahm, Jung Hee Lee, Chang Seok Kim, Jae Eung Oh, Moo Whan Shin

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