Influence of preferred orientation of lead zirconate titanate thin film on the ferroelectric properties

Woo Sik Kim, Jun Kyu Yang, Hyung Ho Park

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

Lead zirconate titanate (PZT) thin films with highly (1 0 0)- and (1 1 1)-preferred orientation are obtained successfully through the control of bottom electrode orientation. The films are investigated in terms of the effect of crystalline orientation on the electric and ferroelectric properties and the microstructure. The differences in electrical properties between (1 0 0)- and (1 1 1)-preferred PZT films are discussed from the viewpoint of the relationship between external field and polarization direction. From the XRD patterns of before and after fatigue, the distortion of crystal structure in (1 0 0)-preferred PZT was observed. From all the above results, we proposed that the grains having (1 0 0) orientation are one of the causes of fatigue.

Original languageEnglish
Pages (from-to)549-552
Number of pages4
JournalApplied Surface Science
Volume169-170
DOIs
Publication statusPublished - 2001 Jan 15

Bibliographical note

Funding Information:
The authors wish to acknowledge the financial support of Korea Research Foundation made in the program year of (1998). Especially, the authors deeply appreciate Hyun-Jung Woo and Dong-Yeon Park served in Inostek Inc. for their assistance in the experiments.

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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