Insulation characteristics and fault analysis of HTS cable via stepped frequency waveform reflectometry

Chun Kwon Lee, Gu Young Kwon, Yeong Ho Lee, Geon Seok Lee, Su Sik Bang, Yong June Shin

Research output: Contribution to journalArticle

Abstract

The characteristics of the HTS cable including conductivity, permittivity, and insulation characteristics vary depending on the conditions of temperature and pressure during operations. We propose a diagnostic method that estimates the propagation constant of the HTS cable and detect the location and the degree of the fault using stepped frequency waveform reflectometry. The performance of proposed method is verified by the HTS cable experiment regarding the propagation constant estimation and the fault detection. The results of HTS cable cooled by the liquid nitrogen are also compared with the results at the room temperature to analyze the insulation characteristics change according to the state. The proposed method is expected to be further applied to monitor the condition of HTS cable system regarding temperature and pressure.

Original languageEnglish
Article number8662584
JournalIEEE Transactions on Applied Superconductivity
Volume29
Issue number5
DOIs
Publication statusPublished - 2019 Aug 1

Fingerprint

insulation
cables
Insulation
waveforms
Cables
fault detection
propagation
Liquid nitrogen
Fault detection
liquid nitrogen
Temperature
Permittivity
permittivity
conductivity
temperature
room temperature
estimates
Experiments

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Lee, Chun Kwon ; Kwon, Gu Young ; Lee, Yeong Ho ; Lee, Geon Seok ; Bang, Su Sik ; Shin, Yong June. / Insulation characteristics and fault analysis of HTS cable via stepped frequency waveform reflectometry. In: IEEE Transactions on Applied Superconductivity. 2019 ; Vol. 29, No. 5.
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Insulation characteristics and fault analysis of HTS cable via stepped frequency waveform reflectometry. / Lee, Chun Kwon; Kwon, Gu Young; Lee, Yeong Ho; Lee, Geon Seok; Bang, Su Sik; Shin, Yong June.

In: IEEE Transactions on Applied Superconductivity, Vol. 29, No. 5, 8662584, 01.08.2019.

Research output: Contribution to journalArticle

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AU - Shin, Yong June

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