Interface location-controlled indium gallium zinc oxide thin-film transistors using a solution process

Jae Won Na, Yeong Gyu Kim, Tae Soo Jung, Young Jun Tak, Sung Pyo Park, Jeong Woo Park, Si Joon Kim, Hyun Jae Kim

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Abstract

The role of an interface as an electron-trapping layer in double-stacked indium gallium zinc oxide (IGZO) thin-film transistors (TFTs) was investigated and interface location-controlled (ILC) IGZO TFTs were introduced. In the ILC TFTs, the thickness of the top and bottom IGZO layers is controlled to change the location of the interface layer. The system exhibited improved electrical characteristics as the location of the interface layer moved further from the gate insulator: field-effect mobility increased from 0.36 to 2.17 cm2 V-1 s-1, and the on-current increased from 2.43 × 10-5 to 1.33 × 10-4 A. The enhanced electrical characteristics are attributed to the absence of an electron-trapping interface layer in the effective channel layer where electrons are accumulated under positive gate bias voltage.

Original languageEnglish
Article number085301
JournalJournal of Physics D: Applied Physics
Volume49
Issue number8
DOIs
Publication statusPublished - 2016 Jan 22

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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