Interface structure and properties of a brass-reinforced Ni59Zr20Ti16Si2Sn3 bulk metallic glass composite

K. Wang, T. Fujita, D. Pan, T. G. Nieh, A. Inoue, Do Hyang Kim, M. W. Chen

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

Interfaces between a Ni59Zr20Ti16Si2Sn3 bulk metallic glass (BMG) and crystalline brass reinforcements were characterized using transmission electron microscopy and nanoindentation. An interfacial layer with a thickness of ∼50-100 nm was observed in the composite prepared by warm extrusion of gas atomized powders. Microstructural characterization and chemical analysis suggest that the formation of interfacial layer was caused by interdiffusion between the BMG and brass during the warm extrusion. Nanoindentation in the vicinity of BMG-brass interfaces does not cause interface decohesion or crack formation, suggesting a strong interface bonding. Apparently, the resultant interfacial layer not only enhances interfacial bonding but also provides a buffer zone to prevent the catastrophic shear band propagation in the BMG matrix.

Original languageEnglish
Pages (from-to)3077-3087
Number of pages11
JournalActa Materialia
Volume56
Issue number13
DOIs
Publication statusPublished - 2008 Aug 1

Fingerprint

Metallic glass
Brass
Composite materials
Nanoindentation
Extrusion
Shear bands
Crack initiation
Powders
Reinforcement
Buffers
Gases
Crystalline materials
Transmission electron microscopy
brass
Chemical analysis

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Wang, K. ; Fujita, T. ; Pan, D. ; Nieh, T. G. ; Inoue, A. ; Kim, Do Hyang ; Chen, M. W. / Interface structure and properties of a brass-reinforced Ni59Zr20Ti16Si2Sn3 bulk metallic glass composite. In: Acta Materialia. 2008 ; Vol. 56, No. 13. pp. 3077-3087.
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Interface structure and properties of a brass-reinforced Ni59Zr20Ti16Si2Sn3 bulk metallic glass composite. / Wang, K.; Fujita, T.; Pan, D.; Nieh, T. G.; Inoue, A.; Kim, Do Hyang; Chen, M. W.

In: Acta Materialia, Vol. 56, No. 13, 01.08.2008, p. 3077-3087.

Research output: Contribution to journalArticle

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AU - Wang, K.

AU - Fujita, T.

AU - Pan, D.

AU - Nieh, T. G.

AU - Inoue, A.

AU - Kim, Do Hyang

AU - Chen, M. W.

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AB - Interfaces between a Ni59Zr20Ti16Si2Sn3 bulk metallic glass (BMG) and crystalline brass reinforcements were characterized using transmission electron microscopy and nanoindentation. An interfacial layer with a thickness of ∼50-100 nm was observed in the composite prepared by warm extrusion of gas atomized powders. Microstructural characterization and chemical analysis suggest that the formation of interfacial layer was caused by interdiffusion between the BMG and brass during the warm extrusion. Nanoindentation in the vicinity of BMG-brass interfaces does not cause interface decohesion or crack formation, suggesting a strong interface bonding. Apparently, the resultant interfacial layer not only enhances interfacial bonding but also provides a buffer zone to prevent the catastrophic shear band propagation in the BMG matrix.

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