Interface study of ion irradiated Cu/Ni/Cu(0 0 2)/Si magnetic thin film by X-ray reflectivity

T. G. Kim, J. H. Lee, J. H. Song, K. H. Chae, S. W. Shin, H. M. Hwang, J. Lee, K. Jeong, C. N. Whang, J. S. Lee, K. B. Lee

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