Interfacial electronic structures between fullerene and multilayer graphene for n-type organic semiconducting devices

Yeonjin Yi; Won Mook Choi; Byoungchul Son; Jeong Won Kim; Seong Jun Kang

doi:10.1016/j.carbon.2011.07.021

Interfacial electronic structures between fullerene and multilayer graphene for n-type organic semiconducting devices

Yeonjin Yi, Won Mook Choi, Byoungchul Son, Jeong Won Kim, Seong Jun Kang

Department of Physics

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

The interfacial electronic structure of fullerene (C₆₀) deposited on a multilayer graphene (MLG) film was measured using in situ ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy. The energy level alignment at the interface of C₆₀/MLG was estimated by the shifts in the highest occupied molecular orbital (HOMO) and the vacuum level during step-by-step deposition of C₆₀ on the MLG. The shift of the HOMO level indicates that there is a small band bending at the interface of C₆₀/MLG. The vacuum level was shifted 0.06 eV toward the low binding energy with additional C₆₀ on the MLG. The measurements reveal that the height of the electron injection barrier is 0.59 eV, while the hole injection barrier height is 2.01 eV. We present a complete interfacial energy level diagram for C₆₀/MLG.

Original language	English
Pages (from-to)	4936-4939
Number of pages	4
Journal	Carbon
Volume	49
Issue number	14
DOIs	https://doi.org/10.1016/j.carbon.2011.07.021
Publication status	Published - 2011 Nov

Bibliographical note

Funding Information:
This work was supported by a research project of the Korea Research Foundation (Grant Nos. 2011-0002411 , 2011-0005787 and 2011-0004748 ).

All Science Journal Classification (ASJC) codes

Chemistry(all)
Materials Science(all)

Access to Document

10.1016/j.carbon.2011.07.021

Cite this

@article{8dd08a6171404fa09e79b83d17d3bd0f,

title = "Interfacial electronic structures between fullerene and multilayer graphene for n-type organic semiconducting devices",

abstract = "The interfacial electronic structure of fullerene (C60) deposited on a multilayer graphene (MLG) film was measured using in situ ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy. The energy level alignment at the interface of C60/MLG was estimated by the shifts in the highest occupied molecular orbital (HOMO) and the vacuum level during step-by-step deposition of C60 on the MLG. The shift of the HOMO level indicates that there is a small band bending at the interface of C60/MLG. The vacuum level was shifted 0.06 eV toward the low binding energy with additional C60 on the MLG. The measurements reveal that the height of the electron injection barrier is 0.59 eV, while the hole injection barrier height is 2.01 eV. We present a complete interfacial energy level diagram for C60/MLG.",

author = "Yeonjin Yi and Choi, {Won Mook} and Byoungchul Son and Kim, {Jeong Won} and Kang, {Seong Jun}",

note = "Funding Information: This work was supported by a research project of the Korea Research Foundation (Grant Nos. 2011-0002411 , 2011-0005787 and 2011-0004748 ).",

year = "2011",

month = nov,

doi = "10.1016/j.carbon.2011.07.021",

language = "English",

volume = "49",

pages = "4936--4939",

journal = "Carbon",

issn = "0008-6223",

publisher = "Elsevier Limited",

number = "14",

}

TY - JOUR

T1 - Interfacial electronic structures between fullerene and multilayer graphene for n-type organic semiconducting devices

AU - Yi, Yeonjin

AU - Choi, Won Mook

AU - Son, Byoungchul

AU - Kim, Jeong Won

AU - Kang, Seong Jun

N1 - Funding Information: This work was supported by a research project of the Korea Research Foundation (Grant Nos. 2011-0002411 , 2011-0005787 and 2011-0004748 ).

PY - 2011/11

Y1 - 2011/11

N2 - The interfacial electronic structure of fullerene (C60) deposited on a multilayer graphene (MLG) film was measured using in situ ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy. The energy level alignment at the interface of C60/MLG was estimated by the shifts in the highest occupied molecular orbital (HOMO) and the vacuum level during step-by-step deposition of C60 on the MLG. The shift of the HOMO level indicates that there is a small band bending at the interface of C60/MLG. The vacuum level was shifted 0.06 eV toward the low binding energy with additional C60 on the MLG. The measurements reveal that the height of the electron injection barrier is 0.59 eV, while the hole injection barrier height is 2.01 eV. We present a complete interfacial energy level diagram for C60/MLG.

AB - The interfacial electronic structure of fullerene (C60) deposited on a multilayer graphene (MLG) film was measured using in situ ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy. The energy level alignment at the interface of C60/MLG was estimated by the shifts in the highest occupied molecular orbital (HOMO) and the vacuum level during step-by-step deposition of C60 on the MLG. The shift of the HOMO level indicates that there is a small band bending at the interface of C60/MLG. The vacuum level was shifted 0.06 eV toward the low binding energy with additional C60 on the MLG. The measurements reveal that the height of the electron injection barrier is 0.59 eV, while the hole injection barrier height is 2.01 eV. We present a complete interfacial energy level diagram for C60/MLG.

UR - http://www.scopus.com/inward/record.url?scp=80051782938&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80051782938&partnerID=8YFLogxK

U2 - 10.1016/j.carbon.2011.07.021

DO - 10.1016/j.carbon.2011.07.021

M3 - Article

AN - SCOPUS:80051782938

SN - 0008-6223

VL - 49

SP - 4936

EP - 4939

JO - Carbon

JF - Carbon

IS - 14

ER -

Interfacial electronic structures between fullerene and multilayer graphene for n-type organic semiconducting devices

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this