The interfaces of YBa2Cu3O7-x (YBCO) superconducting thin films grown on (1 102) r-plane Al2O., by pulsed laser deposition have been investigated by a transmission electron microscopy and an Auger electron spectroscopy depth profile. We used the PrBa2Cu3O7-x (PBCO) buffer layer to prevent the interdiffusion and compared the interfaces of YBCO/Al2O3 and YBCO/PBCO/Al2O3. The intermediate layer in the YBCO film deposited on bare sapphire is visible between the film and the substrate but no boundary layer in the film grown on PBCO buffered sapphire was observed directly by the cross-section image of TEM. The thickness of the intermediate layer in the film on bare sapphire is about 30 nm. This result of TEM observation is consistent with that of AES depth profile.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry