Intergranular film thickness of self-reinforced silicon carbide ceramics

Heon-Jin Choi, Young Wook Kim

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The intergranular film of self-reinforced SiC ceramics prepared by hot pressing and further annealing with SiO2-Y2O3 and SiO2-Al2O3 as sintering additives was observed by high-resolution transmission electron microscopy. The film thickness of SiC ceramics with SiO2 -Y2O3 was ∼1.2 nm whereas that of ceramics with SiO2-Al2O3 was ∼0.8 nm. Based on the refined continuum model, an explanation on the variation of thickness with sintering additives is given. It seems that the behavior of intergranular glassy film of SiC ceramics is akin to that of Si3N4 ceramics.

Original languageEnglish
Pages (from-to)3795-3800
Number of pages6
JournalJournal of the European Ceramic Society
Volume24
Issue number15-16
DOIs
Publication statusPublished - 2004 Dec 1

Fingerprint

Silicon carbide
Film thickness
Sintering
Hot pressing
High resolution transmission electron microscopy
Annealing
silicon carbide
YAS glasses
silicon nitride

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites

Cite this

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abstract = "The intergranular film of self-reinforced SiC ceramics prepared by hot pressing and further annealing with SiO2-Y2O3 and SiO2-Al2O3 as sintering additives was observed by high-resolution transmission electron microscopy. The film thickness of SiC ceramics with SiO2 -Y2O3 was ∼1.2 nm whereas that of ceramics with SiO2-Al2O3 was ∼0.8 nm. Based on the refined continuum model, an explanation on the variation of thickness with sintering additives is given. It seems that the behavior of intergranular glassy film of SiC ceramics is akin to that of Si3N4 ceramics.",
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Intergranular film thickness of self-reinforced silicon carbide ceramics. / Choi, Heon-Jin; Kim, Young Wook.

In: Journal of the European Ceramic Society, Vol. 24, No. 15-16, 01.12.2004, p. 3795-3800.

Research output: Contribution to journalArticle

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