Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.
|Number of pages||7|
|Journal||International Heat Transfer Conference|
|Publication status||Published - 2018|
|Event||16th International Heat Transfer Conference, IHTC 2018 - Beijing, China|
Duration: 2018 Aug 10 → 2018 Aug 15
Bibliographical noteFunding Information:
This work was supported by the GIST Research Institute(GRI) in 2017.
© 2018 International Heat Transfer Conference. All rights reserved.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Mechanical Engineering
- Fluid Flow and Transfer Processes