Interlayer thermal boundary resistance of WSe2 investigated by using time-domain thermoreflectance measurement

Young Gwan Choi; Chan June Zhung; Chang Jae Roh; Hwi In Ju; Tae Yun Kim; Sang Woo Kim; J. S. Lee

doi:10.1615/ihtc16.nmt.023785

Interlayer thermal boundary resistance of WSe2 investigated by using time-domain thermoreflectance measurement

Young Gwan Choi, Chan June Zhung, Chang Jae Roh, Hwi In Ju, Tae Yun Kim, Sang Woo Kim, J. S. Lee

Department of Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.

Original language	English
Pages (from-to)	7265-7271
Number of pages	7
Journal	International Heat Transfer Conference
Volume	2018-August
DOIs	https://doi.org/10.1615/ihtc16.nmt.023785
Publication status	Published - 2018
Event	16th International Heat Transfer Conference, IHTC 2018 - Beijing, China Duration: 2018 Aug 10 → 2018 Aug 15

Bibliographical note

Funding Information:
This work was supported by the GIST Research Institute(GRI) in 2017.

Publisher Copyright:
© 2018 International Heat Transfer Conference. All rights reserved.

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Mechanical Engineering
Fluid Flow and Transfer Processes

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10.1615/ihtc16.nmt.023785

Cite this

@article{290c9aece75f40bcb3422cc1332284b5,

title = "Interlayer thermal boundary resistance of WSe2 investigated by using time-domain thermoreflectance measurement",

abstract = "Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.",

author = "Choi, {Young Gwan} and Zhung, {Chan June} and Roh, {Chang Jae} and Ju, {Hwi In} and Kim, {Tae Yun} and Kim, {Sang Woo} and Lee, {J. S.}",

note = "Funding Information: This work was supported by the GIST Research Institute(GRI) in 2017. Publisher Copyright: {\textcopyright} 2018 International Heat Transfer Conference. All rights reserved.; 16th International Heat Transfer Conference, IHTC 2018 ; Conference date: 10-08-2018 Through 15-08-2018",

year = "2018",

doi = "10.1615/ihtc16.nmt.023785",

language = "English",

volume = "2018-August",

pages = "7265--7271",

journal = "International Heat Transfer Conference",

issn = "2377-424X",

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TY - JOUR

T1 - Interlayer thermal boundary resistance of WSe2 investigated by using time-domain thermoreflectance measurement

AU - Choi, Young Gwan

AU - Zhung, Chan June

AU - Roh, Chang Jae

AU - Ju, Hwi In

AU - Kim, Tae Yun

AU - Kim, Sang Woo

AU - Lee, J. S.

PY - 2018

Y1 - 2018

N2 - Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.

AB - Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.

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DO - 10.1615/ihtc16.nmt.023785

M3 - Conference article

AN - SCOPUS:85068314901

SN - 2377-424X

VL - 2018-August

SP - 7265

EP - 7271

JO - International Heat Transfer Conference

JF - International Heat Transfer Conference

T2 - 16th International Heat Transfer Conference, IHTC 2018

Y2 - 10 August 2018 through 15 August 2018

ER -

Interlayer thermal boundary resistance of WSe2 investigated by using time-domain thermoreflectance measurement

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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