Interleaving test algorithm for subthreshold leakage-current defects in DRAM considering the equal bit line stress

Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, Sungho Kang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Interleaving test algorithm for subthreshold leakage-current defects in DRAM considering the equal bit line stress'. Together they form a unique fingerprint.

Engineering & Materials Science