Intrinsic Correlation between Electronic Structure and Degradation: From Few-Layer to Bulk Black Phosphorus

Minju Kim, Han gyu Kim, Soohyung Park, Jin Sung Kim, Hyoung Joon Choi, Seongil Im, Hyunbok Lee, Taekyeong Kim, Yeonjin Yi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Black phosphorus (BP) has received much attention owing to its fascinating properties, such as a high carrier mobility and tunable band gap. However, these advantages have been overshadowed by the fast degradation of BP under ambient conditions. To overcome this obstacle, the exact degradation mechanisms need to be unveiled. Herein, we analyzed two sequential degradation processes and the layer-dependent degradation rates of BP in the dark by scanning Kelvin probe microscopy (SKPM) measurements and theoretical modeling. The layer-dependent degradation was successfully interpreted by considering the oxidation model based on the Marcus–Gerischer theory (MGT). In the dark, the electron transfer rate from BP to oxygen molecules depends on the number of layers as these systems have different carrier concentrations. This work not only provides a deeper understanding of the degradation mechanism itself but also suggest new strategies for the design of stable BP-based electronics.

Original languageEnglish
Pages (from-to)3754-3758
Number of pages5
JournalAngewandte Chemie - International Edition
Volume58
Issue number12
DOIs
Publication statusPublished - 2019 Mar 18

Fingerprint

Phosphorus
Electronic structure
Degradation
Carrier mobility
Carrier concentration
Microscopic examination
Energy gap
Electronic equipment
Oxygen
Scanning
Oxidation
Molecules
Electrons

All Science Journal Classification (ASJC) codes

  • Catalysis
  • Chemistry(all)

Cite this

Kim, Minju ; Kim, Han gyu ; Park, Soohyung ; Kim, Jin Sung ; Choi, Hyoung Joon ; Im, Seongil ; Lee, Hyunbok ; Kim, Taekyeong ; Yi, Yeonjin. / Intrinsic Correlation between Electronic Structure and Degradation : From Few-Layer to Bulk Black Phosphorus. In: Angewandte Chemie - International Edition. 2019 ; Vol. 58, No. 12. pp. 3754-3758.
@article{8f804c651cf44d10b8749ecae855148f,
title = "Intrinsic Correlation between Electronic Structure and Degradation: From Few-Layer to Bulk Black Phosphorus",
abstract = "Black phosphorus (BP) has received much attention owing to its fascinating properties, such as a high carrier mobility and tunable band gap. However, these advantages have been overshadowed by the fast degradation of BP under ambient conditions. To overcome this obstacle, the exact degradation mechanisms need to be unveiled. Herein, we analyzed two sequential degradation processes and the layer-dependent degradation rates of BP in the dark by scanning Kelvin probe microscopy (SKPM) measurements and theoretical modeling. The layer-dependent degradation was successfully interpreted by considering the oxidation model based on the Marcus–Gerischer theory (MGT). In the dark, the electron transfer rate from BP to oxygen molecules depends on the number of layers as these systems have different carrier concentrations. This work not only provides a deeper understanding of the degradation mechanism itself but also suggest new strategies for the design of stable BP-based electronics.",
author = "Minju Kim and Kim, {Han gyu} and Soohyung Park and Kim, {Jin Sung} and Choi, {Hyoung Joon} and Seongil Im and Hyunbok Lee and Taekyeong Kim and Yeonjin Yi",
year = "2019",
month = "3",
day = "18",
doi = "10.1002/anie.201811743",
language = "English",
volume = "58",
pages = "3754--3758",
journal = "Angewandte Chemie - International Edition",
issn = "1433-7851",
publisher = "John Wiley and Sons Ltd",
number = "12",

}

Intrinsic Correlation between Electronic Structure and Degradation : From Few-Layer to Bulk Black Phosphorus. / Kim, Minju; Kim, Han gyu; Park, Soohyung; Kim, Jin Sung; Choi, Hyoung Joon; Im, Seongil; Lee, Hyunbok; Kim, Taekyeong; Yi, Yeonjin.

In: Angewandte Chemie - International Edition, Vol. 58, No. 12, 18.03.2019, p. 3754-3758.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Intrinsic Correlation between Electronic Structure and Degradation

T2 - From Few-Layer to Bulk Black Phosphorus

AU - Kim, Minju

AU - Kim, Han gyu

AU - Park, Soohyung

AU - Kim, Jin Sung

AU - Choi, Hyoung Joon

AU - Im, Seongil

AU - Lee, Hyunbok

AU - Kim, Taekyeong

AU - Yi, Yeonjin

PY - 2019/3/18

Y1 - 2019/3/18

N2 - Black phosphorus (BP) has received much attention owing to its fascinating properties, such as a high carrier mobility and tunable band gap. However, these advantages have been overshadowed by the fast degradation of BP under ambient conditions. To overcome this obstacle, the exact degradation mechanisms need to be unveiled. Herein, we analyzed two sequential degradation processes and the layer-dependent degradation rates of BP in the dark by scanning Kelvin probe microscopy (SKPM) measurements and theoretical modeling. The layer-dependent degradation was successfully interpreted by considering the oxidation model based on the Marcus–Gerischer theory (MGT). In the dark, the electron transfer rate from BP to oxygen molecules depends on the number of layers as these systems have different carrier concentrations. This work not only provides a deeper understanding of the degradation mechanism itself but also suggest new strategies for the design of stable BP-based electronics.

AB - Black phosphorus (BP) has received much attention owing to its fascinating properties, such as a high carrier mobility and tunable band gap. However, these advantages have been overshadowed by the fast degradation of BP under ambient conditions. To overcome this obstacle, the exact degradation mechanisms need to be unveiled. Herein, we analyzed two sequential degradation processes and the layer-dependent degradation rates of BP in the dark by scanning Kelvin probe microscopy (SKPM) measurements and theoretical modeling. The layer-dependent degradation was successfully interpreted by considering the oxidation model based on the Marcus–Gerischer theory (MGT). In the dark, the electron transfer rate from BP to oxygen molecules depends on the number of layers as these systems have different carrier concentrations. This work not only provides a deeper understanding of the degradation mechanism itself but also suggest new strategies for the design of stable BP-based electronics.

UR - http://www.scopus.com/inward/record.url?scp=85060193732&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85060193732&partnerID=8YFLogxK

U2 - 10.1002/anie.201811743

DO - 10.1002/anie.201811743

M3 - Article

C2 - 30548756

AN - SCOPUS:85060193732

VL - 58

SP - 3754

EP - 3758

JO - Angewandte Chemie - International Edition

JF - Angewandte Chemie - International Edition

SN - 1433-7851

IS - 12

ER -