Investigation of 3-D embedded inductors using Monte Carlo analysis

Seogoo Lee; Jongseong Choi; Gary S. May; Ilgu Yun

doi:10.1109/IEMT.2002.1032764

Investigation of 3-D embedded inductors using Monte Carlo analysis

Seogoo Lee, Jongseong Choi, Gary S. May, Ilgu Yun

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

In this paper, the statistical analysis of 3-D solenoid inductors manufactured in a multilayer low-temperature cofired ceramic (LTCC) process is presented. A set of integrated inductor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 Mhz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the inductor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that for even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall inductor performance.

Original language	English
Article number	44
Pages (from-to)	259-263
Number of pages	5
Journal	Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium
DOIs	https://doi.org/10.1109/IEMT.2002.1032764
Publication status	Published - 2002

All Science Journal Classification (ASJC) codes

Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

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10.1109/IEMT.2002.1032764

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title = "Investigation of 3-D embedded inductors using Monte Carlo analysis",

abstract = "In this paper, the statistical analysis of 3-D solenoid inductors manufactured in a multilayer low-temperature cofired ceramic (LTCC) process is presented. A set of integrated inductor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 Mhz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the inductor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that for even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall inductor performance.",

author = "Seogoo Lee and Jongseong Choi and May, {Gary S.} and Ilgu Yun",

year = "2002",

doi = "10.1109/IEMT.2002.1032764",

language = "English",

pages = "259--263",

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AU - Lee, Seogoo

AU - Choi, Jongseong

AU - May, Gary S.

AU - Yun, Ilgu

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N2 - In this paper, the statistical analysis of 3-D solenoid inductors manufactured in a multilayer low-temperature cofired ceramic (LTCC) process is presented. A set of integrated inductor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 Mhz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the inductor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that for even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall inductor performance.

AB - In this paper, the statistical analysis of 3-D solenoid inductors manufactured in a multilayer low-temperature cofired ceramic (LTCC) process is presented. A set of integrated inductor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 Mhz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the inductor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that for even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall inductor performance.

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ER -

Investigation of 3-D embedded inductors using Monte Carlo analysis

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