Investigation of 3-D embedded inductors using Monte Carlo analysis

Seogoo Lee, Jongseong Choi, Gary S. May, Ilgu Yun

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this paper, the statistical analysis of 3-D solenoid inductors manufactured in a multilayer low-temperature cofired ceramic (LTCC) process is presented. A set of integrated inductor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 Mhz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the inductor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that for even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall inductor performance.

Original languageEnglish
Article number44
Pages (from-to)259-263
Number of pages5
JournalProceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium
DOIs
Publication statusPublished - 2002 Jan 1

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Solenoids
Scattering parameters
Equivalent circuits
Statistical methods
Multilayers
Temperature

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

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Investigation of 3-D embedded inductors using Monte Carlo analysis. / Lee, Seogoo; Choi, Jongseong; May, Gary S.; Yun, Ilgu.

In: Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, 01.01.2002, p. 259-263.

Research output: Contribution to journalArticle

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