Investigation of Ge profile on SiGe islands by scanning photoelectron microscopy

M. H. Cho, Y. J. Cho, M. K. Lee, S. A. Park, Y. S. Roh, Y. K. Kim, K. Jeong, S. K. Kang, D. H. Ko, H. J. Shin, K. W. Kwon

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)1012-1016
Number of pages5
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume22
Issue number3
DOIs
Publication statusPublished - 2004

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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