Investigation of length-dependent characteristics of the voltage-induced metal insulator transition in VO2 film devices

Joonseok Yoon, Giyong Lee, Changwoo Park, Bongjin Simon Mun, Honglyoul Ju

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Abstract

The characteristics of the voltage-induced metal insulator transition (MIT) of VO2 film devices are investigated as a function of ambient temperature and length. At the onset of voltage-induced MIT, an abrupt formation of a conduction channel is observed within the insulating phase. The carrier density of the device varies with ambient temperature (TA) and device length (L) across MIT. As the device length is reduced, a statistically random appearance of the conduction channel is observed. Our results suggest that the primary operation principles of the VO2 device can be chosen between Joule heating effect and the electric field effect.

Original languageEnglish
Article number083503
JournalApplied Physics Letters
Volume105
Issue number8
DOIs
Publication statusPublished - 2014 Aug 25

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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