Investigation of length-dependent characteristics of the voltage-induced metal insulator transition in VO2 film devices

Joonseok Yoon; Giyong Lee; Changwoo Park; Bongjin Simon Mun; Honglyoul Ju

doi:10.1063/1.4893783

Investigation of length-dependent characteristics of the voltage-induced metal insulator transition in VO₂ film devices

Joonseok Yoon, Giyong Lee, Changwoo Park, Bongjin Simon Mun, Honglyoul Ju

Department of Physics

Research output: Contribution to journal › Article › peer-review

38 Citations (Scopus)

Abstract

The characteristics of the voltage-induced metal insulator transition (MIT) of VO₂ film devices are investigated as a function of ambient temperature and length. At the onset of voltage-induced MIT, an abrupt formation of a conduction channel is observed within the insulating phase. The carrier density of the device varies with ambient temperature (T_A) and device length (L) across MIT. As the device length is reduced, a statistically random appearance of the conduction channel is observed. Our results suggest that the primary operation principles of the VO₂ device can be chosen between Joule heating effect and the electric field effect.

Original language	English
Article number	083503
Journal	Applied Physics Letters
Volume	105
Issue number	8
DOIs	https://doi.org/10.1063/1.4893783
Publication status	Published - 2014 Aug 25

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.4893783

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title = "Investigation of length-dependent characteristics of the voltage-induced metal insulator transition in VO2 film devices",

abstract = "The characteristics of the voltage-induced metal insulator transition (MIT) of VO2 film devices are investigated as a function of ambient temperature and length. At the onset of voltage-induced MIT, an abrupt formation of a conduction channel is observed within the insulating phase. The carrier density of the device varies with ambient temperature (TA) and device length (L) across MIT. As the device length is reduced, a statistically random appearance of the conduction channel is observed. Our results suggest that the primary operation principles of the VO2 device can be chosen between Joule heating effect and the electric field effect.",

author = "Joonseok Yoon and Giyong Lee and Changwoo Park and Mun, {Bongjin Simon} and Honglyoul Ju",

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T1 - Investigation of length-dependent characteristics of the voltage-induced metal insulator transition in VO2 film devices

AU - Yoon, Joonseok

AU - Lee, Giyong

AU - Park, Changwoo

AU - Mun, Bongjin Simon

AU - Ju, Honglyoul

PY - 2014/8/25

Y1 - 2014/8/25

N2 - The characteristics of the voltage-induced metal insulator transition (MIT) of VO2 film devices are investigated as a function of ambient temperature and length. At the onset of voltage-induced MIT, an abrupt formation of a conduction channel is observed within the insulating phase. The carrier density of the device varies with ambient temperature (TA) and device length (L) across MIT. As the device length is reduced, a statistically random appearance of the conduction channel is observed. Our results suggest that the primary operation principles of the VO2 device can be chosen between Joule heating effect and the electric field effect.

AB - The characteristics of the voltage-induced metal insulator transition (MIT) of VO2 film devices are investigated as a function of ambient temperature and length. At the onset of voltage-induced MIT, an abrupt formation of a conduction channel is observed within the insulating phase. The carrier density of the device varies with ambient temperature (TA) and device length (L) across MIT. As the device length is reduced, a statistically random appearance of the conduction channel is observed. Our results suggest that the primary operation principles of the VO2 device can be chosen between Joule heating effect and the electric field effect.

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Investigation of length-dependent characteristics of the voltage-induced metal insulator transition in VO₂ film devices

Abstract

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