Investigation of phase transition of Ge2 Sb2 Te5 and N-incorporated Ge2 Sb2 Te5 films using x-ray absorption spectroscopy

Youngkuk Kim, M. H. Jang, K. Jeong, M. H. Cho, K. H. Do, D. H. Ko, H. C. Sohn, Min Gyu Kim

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18 Citations (Scopus)

Abstract

For this study, the phase-change materials Ge2 Sb2 Te5 and N-doped Ge2 Sb2 Te5 films were investigated using x-ray absorption near-edge structure and extended x-ray absorption fine structure. During the phase transition, change in electronic structure is observed by the shift of the absorption edge energy, i.e., structural coordination of Ge-Te changes from tetrahedral to octahedral coordination, of which the interatomic distances are 3.12 and 2.83 Å, respectively. In addition, nitrogen incorporation into the film led to a p-p orbital hybridization and a different crystallization behavior. The hybridization caused by the formation of a Ge-N bond was related to suppression of the phase transition.

Original languageEnglish
Article number061910
JournalApplied Physics Letters
Volume92
Issue number6
DOIs
Publication statusPublished - 2008 Feb 22

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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