Abstract
The characteristics of ion beam (IB) irradiated polyethylene glycol (PEG) films were analyzed to determine their potential use as a liquid crystal (LC) alignment layer. The transmittance of the PEG films at various IB intensities was measured to verify the possibility of using it as an alignment layer. Anti-parallel cells with the PEG film were fabricated to examine the LC alignment characteristics. Perfectly dark cross-polarized microscopy images were obtained at an intensity of 700 eV, which indicates uniform LC alignment, and pre-tilt angle measurements supported this finding. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) analyses were conducted to determine the effect of the IB irradiation on the PEG film on the surface modification. After exposure at an IB intensity of 700 eV where uniform LC alignment was achieved, remarkable chemical composition modification of the PEG film, including the reduction of C-O bonds that affected the uniform LC alignment, was observed via the XPS analysis. Furthermore, the AFM analysis revealed that low kurtosis value was obtained at this IB intensity. Therefore, we are convinced that the PEG films irradiated at this low IB intensity show potential as alternative alignment layer in LC applications.
| Original language | English |
|---|---|
| Pages (from-to) | 368-374 |
| Number of pages | 7 |
| Journal | Soft Materials |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2019 Oct 2 |
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All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
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Ion-beam irradiation modified chemical and physical surface characteristics of polyethylene glycol film for liquid crystal aligning. / Jeong, Hae Chang; Won, Jonghoon; Lee, Ju Hwan; Kim, Dong Hyun; Lee, Dong Wook; Oh, Byeong Yun; Han, Jeong Min; Seo, Dae Shik.
In: Soft Materials, Vol. 17, No. 4, 02.10.2019, p. 368-374.Research output: Contribution to journal › Article
TY - JOUR
T1 - Ion-beam irradiation modified chemical and physical surface characteristics of polyethylene glycol film for liquid crystal aligning
AU - Jeong, Hae Chang
AU - Won, Jonghoon
AU - Lee, Ju Hwan
AU - Kim, Dong Hyun
AU - Lee, Dong Wook
AU - Oh, Byeong Yun
AU - Han, Jeong Min
AU - Seo, Dae Shik
PY - 2019/10/2
Y1 - 2019/10/2
N2 - The characteristics of ion beam (IB) irradiated polyethylene glycol (PEG) films were analyzed to determine their potential use as a liquid crystal (LC) alignment layer. The transmittance of the PEG films at various IB intensities was measured to verify the possibility of using it as an alignment layer. Anti-parallel cells with the PEG film were fabricated to examine the LC alignment characteristics. Perfectly dark cross-polarized microscopy images were obtained at an intensity of 700 eV, which indicates uniform LC alignment, and pre-tilt angle measurements supported this finding. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) analyses were conducted to determine the effect of the IB irradiation on the PEG film on the surface modification. After exposure at an IB intensity of 700 eV where uniform LC alignment was achieved, remarkable chemical composition modification of the PEG film, including the reduction of C-O bonds that affected the uniform LC alignment, was observed via the XPS analysis. Furthermore, the AFM analysis revealed that low kurtosis value was obtained at this IB intensity. Therefore, we are convinced that the PEG films irradiated at this low IB intensity show potential as alternative alignment layer in LC applications.
AB - The characteristics of ion beam (IB) irradiated polyethylene glycol (PEG) films were analyzed to determine their potential use as a liquid crystal (LC) alignment layer. The transmittance of the PEG films at various IB intensities was measured to verify the possibility of using it as an alignment layer. Anti-parallel cells with the PEG film were fabricated to examine the LC alignment characteristics. Perfectly dark cross-polarized microscopy images were obtained at an intensity of 700 eV, which indicates uniform LC alignment, and pre-tilt angle measurements supported this finding. X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) analyses were conducted to determine the effect of the IB irradiation on the PEG film on the surface modification. After exposure at an IB intensity of 700 eV where uniform LC alignment was achieved, remarkable chemical composition modification of the PEG film, including the reduction of C-O bonds that affected the uniform LC alignment, was observed via the XPS analysis. Furthermore, the AFM analysis revealed that low kurtosis value was obtained at this IB intensity. Therefore, we are convinced that the PEG films irradiated at this low IB intensity show potential as alternative alignment layer in LC applications.
UR - http://www.scopus.com/inward/record.url?scp=85065242128&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85065242128&partnerID=8YFLogxK
U2 - 10.1080/1539445X.2019.1609512
DO - 10.1080/1539445X.2019.1609512
M3 - Article
AN - SCOPUS:85065242128
VL - 17
SP - 368
EP - 374
JO - Soft Materials
JF - Soft Materials
SN - 1539-445X
IS - 4
ER -