IR-UWB radar-based near-field head rotation movement sensing under fixed body motions

Sunghwa Lee, Jiwon Seo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this study, we propose a method to measure a head rotation movement using an impulse radio ultra-wideband (IR-UWB) radar. The method modifies the pulse Doppler processing technique to extract a specific one-dimensional array, which represents the time of arrival (TOA) information of the head motion, from a frame buffer. Head movement sensing can be utilized to differentiate an intended human motion from an unintended head motion. A human interface device can also utilize head movement information.

Original languageEnglish
Title of host publicationInternational Conference on Electronics, Information and Communication, ICEIC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
ISBN (Electronic)9781538647547
DOIs
Publication statusPublished - 2018 Apr 2
Event17th International Conference on Electronics, Information and Communication, ICEIC 2018 - Honolulu, United States
Duration: 2018 Jan 242018 Jan 27

Publication series

NameInternational Conference on Electronics, Information and Communication, ICEIC 2018
Volume2018-January

Other

Other17th International Conference on Electronics, Information and Communication, ICEIC 2018
CountryUnited States
CityHonolulu
Period18/1/2418/1/27

All Science Journal Classification (ASJC) codes

  • Information Systems
  • Computer Networks and Communications
  • Computer Science Applications
  • Signal Processing
  • Electrical and Electronic Engineering

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  • Cite this

    Lee, S., & Seo, J. (2018). IR-UWB radar-based near-field head rotation movement sensing under fixed body motions. In International Conference on Electronics, Information and Communication, ICEIC 2018 (pp. 1-3). (International Conference on Electronics, Information and Communication, ICEIC 2018; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ELINFOCOM.2018.8330555