Abstract
We study surface plasmon resonance microscopy (SPRM) for label-free quantification of cell-to-substrate separation. We have established a depth extraction model in which we compare a layered cell substrate model with resonance characteristics obtained by SPRM. We have applied the model to human aortic endothelial cell (HAEC) culture and determined the separation distance to be 40–60 nm. We have also investigated the precision of the SPRM model associated with the deviation in the model parameters, which is estimated to be 15 nm. The results can serve as the basis for more extensive cell-to-surface studies in a massive and automated way.
| Original language | English |
|---|---|
| Pages (from-to) | 64-68 |
| Number of pages | 5 |
| Journal | Optics Communications |
| Volume | 422 |
| DOIs | |
| Publication status | Published - 2018 Sep 1 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
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Label-free quantification of cell-to-substrate separation by surface plasmon resonance microscopy. / Son, Taehwang; Seo, Jinwon; Choi, In Hong; Kim, Donghyun.
In: Optics Communications, Vol. 422, 01.09.2018, p. 64-68.Research output: Contribution to journal › Article
TY - JOUR
T1 - Label-free quantification of cell-to-substrate separation by surface plasmon resonance microscopy
AU - Son, Taehwang
AU - Seo, Jinwon
AU - Choi, In Hong
AU - Kim, Donghyun
PY - 2018/9/1
Y1 - 2018/9/1
N2 - We study surface plasmon resonance microscopy (SPRM) for label-free quantification of cell-to-substrate separation. We have established a depth extraction model in which we compare a layered cell substrate model with resonance characteristics obtained by SPRM. We have applied the model to human aortic endothelial cell (HAEC) culture and determined the separation distance to be 40–60 nm. We have also investigated the precision of the SPRM model associated with the deviation in the model parameters, which is estimated to be 15 nm. The results can serve as the basis for more extensive cell-to-surface studies in a massive and automated way.
AB - We study surface plasmon resonance microscopy (SPRM) for label-free quantification of cell-to-substrate separation. We have established a depth extraction model in which we compare a layered cell substrate model with resonance characteristics obtained by SPRM. We have applied the model to human aortic endothelial cell (HAEC) culture and determined the separation distance to be 40–60 nm. We have also investigated the precision of the SPRM model associated with the deviation in the model parameters, which is estimated to be 15 nm. The results can serve as the basis for more extensive cell-to-surface studies in a massive and automated way.
UR - http://www.scopus.com/inward/record.url?scp=85031321976&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85031321976&partnerID=8YFLogxK
U2 - 10.1016/j.optcom.2017.10.001
DO - 10.1016/j.optcom.2017.10.001
M3 - Article
AN - SCOPUS:85031321976
VL - 422
SP - 64
EP - 68
JO - Optics Communications
JF - Optics Communications
SN - 0030-4018
ER -