We investigate the lateral far-field pattern characteristics, including divergence angle change and far-field pattern analysis as output power increases, of narrow-emitter-width 850 nm GaAs/AlGaAs laser diodes (LDs). Each LD has a cavity of 1200 and 1500 μm and narrow emitter width of 2.4 μm for the top and 4.6 μm for the bottom. The threshold currents are 35 and 40 mA, and L-I kinks appear at power levels of 326 and 403 mW, respectively. The divergence angle tends to increase due to the occurrence of first-order lateral mode and the thermal lensing effect. But with the L-I kink, the divergence angle decreases and the far-field pattern becomes asymmetric. This is due to coherent superposition between the fundamental and the first-order lateral mode. We provide detailed explanations for these observations based on high-power laser diode simulation results.
|Number of pages||5|
|Journal||Current Optics and Photonics|
|Publication status||Published - 2022 Apr 25|
Bibliographical noteFunding Information:
Research Fund of High Efficiency Laser Laboratory of the Agency for Defense Development of Korea (NO. UD190015ID).
© 2022 Current Optics and Photonics.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics