Liquid crystal alignment capabilities on SiNx thin films via ion-beam irradiation

Byoung Yong Kim, Young Hwan Kim, Hong Gyu Park, Byeong Yun Oh, Jeong Yeon Hwang, Hyun Jae Na, Won Kyu Lee, Ji Hun Lim, Dae Shik Seo, Jeong Min Han

Research output: Contribution to journalArticle

Abstract

The aligned liquid crystals (LCs) display on SiNx thin films using ion-beam (IB) irradiation was studied with controllability of pretilt angle depending on incident energies of the IB. The LCs alignment property for the SiNx thin films were observed to verify the practical application potential. A good LCs alignment of vertical alignment LCs cells on SiNx thin film surfaces irradiated with incident IB energy of 1800 eV was achieved. The atomic force microscopy (AFM) images of LCs on SiNx thin film surfaces irradiated with IB energy was used for the surface analysis.

Original languageEnglish
Pages (from-to)76-82
Number of pages7
JournalFerroelectrics
Volume396
Issue number1
DOIs
Publication statusPublished - 2010 Aug 2

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kim, B. Y., Kim, Y. H., Park, H. G., Oh, B. Y., Hwang, J. Y., Na, H. J., Lee, W. K., Lim, J. H., Seo, D. S., & Han, J. M. (2010). Liquid crystal alignment capabilities on SiNx thin films via ion-beam irradiation. Ferroelectrics, 396(1), 76-82. https://doi.org/10.1080/00150191003795452