TY - JOUR
T1 - Liquid crystal lens for compensation of spherical aberration in multilayer optical data storage
AU - Chung, Suk Ho
AU - Choi, Seong Wook
AU - Kim, Young Joo
AU - Ahn, Han Jin
AU - Baik, Hong Koo
PY - 2006/2/24
Y1 - 2006/2/24
N2 - In multilayer recording, it is strongly required to compensate the spherical aberration caused by a difference in substrate thickness. A novel liquid crystal (LC) lens is designed and fabricated to compensate the spherical aberration in this study. The new structure of the LC lens includes both concave and convex surfaces, which can compensate the spherical aberration with a relatively long range. Since a previously developed LC panel showed a very low tolerance to the shift of an objective lens, a new component has been proposed with a special LC lens structure to improve both the tolerance and compensation range. By optimized curvature control with a spherical LC lens, the aberration of a Blu-ray optical pickup can be maintained at 0.018λrms even for a thickness variation of ±25 μm. Finally, the LC lens has been fabricated using a standard one drop filling (ODF) process and evaluated by measuring the variation in focal length as a function of applied voltage.
AB - In multilayer recording, it is strongly required to compensate the spherical aberration caused by a difference in substrate thickness. A novel liquid crystal (LC) lens is designed and fabricated to compensate the spherical aberration in this study. The new structure of the LC lens includes both concave and convex surfaces, which can compensate the spherical aberration with a relatively long range. Since a previously developed LC panel showed a very low tolerance to the shift of an objective lens, a new component has been proposed with a special LC lens structure to improve both the tolerance and compensation range. By optimized curvature control with a spherical LC lens, the aberration of a Blu-ray optical pickup can be maintained at 0.018λrms even for a thickness variation of ±25 μm. Finally, the LC lens has been fabricated using a standard one drop filling (ODF) process and evaluated by measuring the variation in focal length as a function of applied voltage.
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U2 - 10.1143/JJAP.45.1152
DO - 10.1143/JJAP.45.1152
M3 - Article
AN - SCOPUS:33644512394
SN - 0021-4922
VL - 45
SP - 1152
EP - 1157
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 2 B
ER -