Localization-based full-field microscopy

How to attain super-resolved images

Taehwang Son, Wonju Lee, Donghyun Kim

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In this study, we have investigated localization-based microscopy to achieve full-field super-resolution. For localized sampling, we have considered combs consisting of unit pulses and near-fields localized by surface nanoapertures. Achievable images after reconstruction were assessed in terms of peak signal-to-noise ratio (PSNR). It was found that spatial switching of individual pulses may be needed to break the diffraction limit. Among the parameters, the resolution was largely determined by sampling period while the effect of width of a sampling pulse on PSNR was relatively limited. For the range of sampling parameters that we considered, the highest resolution achievable is estimated to be 70nm, which can further be enhanced by optimizing the localization parameters.

Original languageEnglish
Article number12365
JournalScientific reports
Volume5
DOIs
Publication statusPublished - 2015 Jul 23

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sampling
microscopy
signal to noise ratios
pulses
image reconstruction
near fields
high resolution
diffraction

All Science Journal Classification (ASJC) codes

  • General

Cite this

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Localization-based full-field microscopy : How to attain super-resolved images. / Son, Taehwang; Lee, Wonju; Kim, Donghyun.

In: Scientific reports, Vol. 5, 12365, 23.07.2015.

Research output: Contribution to journalArticle

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