There has been much research about STED microscopy to reduce cost. In that microscopy, it is necessary to synchronize the pulsed lights which is just for initial setup. However, there has not been researched in order to reduce this expense until now. So, in this paper, we propose the low-cost strategy to measure the time delay in STED microscopy. To achieve that, we utilized TCSPC principle with a general digital oscilloscope. As a result, we attained successful measurement and adjustment about two pulsed lights with 180-ps delay in STED system.
|Title of host publication||MOC 2015 - Technical Digest of 20th Microoptics Conference|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Publication status||Published - 2016 Feb 23|
|Event||20th Microoptics Conference, MOC 2015 - Fukuoka, Japan|
Duration: 2015 Oct 25 → 2015 Oct 28
|Name||MOC 2015 - Technical Digest of 20th Microoptics Conference|
|Other||20th Microoptics Conference, MOC 2015|
|Period||15/10/25 → 15/10/28|
Bibliographical noteFunding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (NRF-2013R1A2A1A01016979).
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials