Low frequency noise measurement in YBa2Cu3Ox thick films

Kyung-hwa Yoo, J. C. Park

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Abstract

The measurements of the low frequency noise near the transition temperature in YBa2Cu3Ox thick films having different shape of the superconducting resistive transition curve are reported. The results show that temperature dependence of the noise power is dependent on the resistive transition width. For the sample whose resistive transition is sharp, a single noise peak is observed near Tco. On the other hand, the sample, whose resistive transition is broad, exhibits two noise peaks near Tco and onset Tc. The investigation of the current and magnetic field dependence of the noise power suggests that the noise peak near Tco may be due to the vortex motion, while the noise peak near onset Tc may be associated with the thermal fluctuation.

Original languageEnglish
Pages (from-to)1405-1406
Number of pages2
JournalPhysica B: Condensed Matter
Volume165-166
DOIs
Publication statusPublished - 1990 Jan 1

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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