Low-noise in-pixel comparing active pixel sensor using column-level single-slope ADC

Dongmyung Lee, Kunhee Cho, Dongsoo Kim, Gunhee Han

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

A conventional active pixel sensor (APS) uses a source follower (SF) in a pixel as a buffer. This SF is one of the major causes of nonlinearity, sensitivity degradation, and pixel readout noise. The proposed in-pixel comparing APS uses pixel transistors as a part of comparator for a single-slope ADC instead of using them as an SF. The prototype sensor was fabricated using a 0.35-μm 2P3M CMOS process. Experimental results show 15-times linearity improvement, 26% sensitivity enhancement, and 33% noise reduction over the conventional APS.

Original languageEnglish
Pages (from-to)3383-3388
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume55
Issue number12
DOIs
Publication statusPublished - 2008 Dec 10

Fingerprint

Pixels
Sensors
Noise abatement
Buffers
Transistors
Degradation

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Lee, Dongmyung ; Cho, Kunhee ; Kim, Dongsoo ; Han, Gunhee. / Low-noise in-pixel comparing active pixel sensor using column-level single-slope ADC. In: IEEE Transactions on Electron Devices. 2008 ; Vol. 55, No. 12. pp. 3383-3388.
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Low-noise in-pixel comparing active pixel sensor using column-level single-slope ADC. / Lee, Dongmyung; Cho, Kunhee; Kim, Dongsoo; Han, Gunhee.

In: IEEE Transactions on Electron Devices, Vol. 55, No. 12, 10.12.2008, p. 3383-3388.

Research output: Contribution to journalArticle

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