Low-noise in-pixel comparing active pixel sensor using column-level single-slope ADC

Dongmyung Lee, Kunhee Cho, Dongsoo Kim, Gunhee Han

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

A conventional active pixel sensor (APS) uses a source follower (SF) in a pixel as a buffer. This SF is one of the major causes of nonlinearity, sensitivity degradation, and pixel readout noise. The proposed in-pixel comparing APS uses pixel transistors as a part of comparator for a single-slope ADC instead of using them as an SF. The prototype sensor was fabricated using a 0.35-μm 2P3M CMOS process. Experimental results show 15-times linearity improvement, 26% sensitivity enhancement, and 33% noise reduction over the conventional APS.

Original languageEnglish
Pages (from-to)3383-3388
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume55
Issue number12
DOIs
Publication statusPublished - 2008 Dec 10

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this