Low power scan bypass technique with test data reduction

Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The exponential advance in semiconductor manufacturing technology is bringing heavy increase not only in power consumption but in test data volume as well. Moreover, power consumption in test mode is much higher than that in the functional operation mode. In this paper, a low power scan bypass technique is proposed to reduce both the test data volume and the test power consumption. The proposed technique can reduce both test data volume and power consumption with the minimal impact on area overhead. Unused segments, which consist of don't care bits, can be bypassed in the proposed scan bypass technique. In order to maximize the bypassing portion, scan cell ordering and pattern ordering are performed. Experimental results show that the proposed technique efficiently reduce test power and test data volume with a small overhead.

Original languageEnglish
Title of host publicationProceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015
PublisherIEEE Computer Society
Pages173-176
Number of pages4
Volume2015-April
ISBN (Electronic)9781479975815
DOIs
Publication statusPublished - 2015 Jan 1
Event16th International Symposium on Quality Electronic Design, ISQED 2015 - Santa Clara, United States
Duration: 2015 Mar 22015 Mar 4

Other

Other16th International Symposium on Quality Electronic Design, ISQED 2015
CountryUnited States
CitySanta Clara
Period15/3/215/3/4

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All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Lim, H., Kang, W., Seo, S., Lee, Y., & Kang, S. (2015). Low power scan bypass technique with test data reduction. In Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015 (Vol. 2015-April, pp. 173-176). [7085419] IEEE Computer Society. https://doi.org/10.1109/ISQED.2015.7085419