Abstract
Polyester filament yam fabric specimens, plain, twill, and satin with varying levels of yam twist, are prepared to measure their luster properties. Images of the fabrics under specific illumination and viewing angles are acquired for further luster characterization, since the reflectance properties of the fabrics are highly angle-dependent. Along with the image analyses, goniometric luster is analyzed at varying angles to support macrolevel luster characterization. As yam twist increases, the luster unit size diminishes accordingly, resulting in macrolevel gloss decreases. While conventional goniometric gloss measure ments represent the macrolevel luster properties of fabrics, detailed analyses of luster images provide an explanation of the “quality” of fabric luster.
| Original language | English |
|---|---|
| Pages (from-to) | 72-77 |
| Number of pages | 6 |
| Journal | Textile Research Journal |
| Volume | 74 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2004 Jan 1 |
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All Science Journal Classification (ASJC) codes
- Chemical Engineering (miscellaneous)
- Polymers and Plastics
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Luster Properties of Polyester Filament Yarn Woven Fabrics. / Kim, Jong Jun; in Shin, Kyung; Ryu, Hyo Seon; Kim, Eunae; Lee, Meesik; Wha oh, Kyung.
In: Textile Research Journal, Vol. 74, No. 1, 01.01.2004, p. 72-77.Research output: Contribution to journal › Article
TY - JOUR
T1 - Luster Properties of Polyester Filament Yarn Woven Fabrics
AU - Kim, Jong Jun
AU - in Shin, Kyung
AU - Ryu, Hyo Seon
AU - Kim, Eunae
AU - Lee, Meesik
AU - Wha oh, Kyung
PY - 2004/1/1
Y1 - 2004/1/1
N2 - Polyester filament yam fabric specimens, plain, twill, and satin with varying levels of yam twist, are prepared to measure their luster properties. Images of the fabrics under specific illumination and viewing angles are acquired for further luster characterization, since the reflectance properties of the fabrics are highly angle-dependent. Along with the image analyses, goniometric luster is analyzed at varying angles to support macrolevel luster characterization. As yam twist increases, the luster unit size diminishes accordingly, resulting in macrolevel gloss decreases. While conventional goniometric gloss measure ments represent the macrolevel luster properties of fabrics, detailed analyses of luster images provide an explanation of the “quality” of fabric luster.
AB - Polyester filament yam fabric specimens, plain, twill, and satin with varying levels of yam twist, are prepared to measure their luster properties. Images of the fabrics under specific illumination and viewing angles are acquired for further luster characterization, since the reflectance properties of the fabrics are highly angle-dependent. Along with the image analyses, goniometric luster is analyzed at varying angles to support macrolevel luster characterization. As yam twist increases, the luster unit size diminishes accordingly, resulting in macrolevel gloss decreases. While conventional goniometric gloss measure ments represent the macrolevel luster properties of fabrics, detailed analyses of luster images provide an explanation of the “quality” of fabric luster.
UR - http://www.scopus.com/inward/record.url?scp=1342265875&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=1342265875&partnerID=8YFLogxK
U2 - 10.1177/004051750407400113
DO - 10.1177/004051750407400113
M3 - Article
AN - SCOPUS:1342265875
VL - 74
SP - 72
EP - 77
JO - Textile Reseach Journal
JF - Textile Reseach Journal
SN - 0040-5175
IS - 1
ER -