Magnetotransport properties of perovskite La-Ba-Mn-O-deposited films on Si substrates

Jong Cheol Lee, Sang Yub Ie, Seung Iel Park, Chul Sung Kim, Kwangho Jeong

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

To obtain high MR ratio near room temperature in thin films grown on Si substrate, La-Ba-Mn-O thin films were prepared with various substrate temperature (TS) from 600°C to 720°C by RF magnetron sputtering, and the structural and magnetotransport properties were studied. All films were annealed at 800°C for 30 min in ambient. The structures, magnetic properties and compositions of La-Ba-Mn-O thin films have been studied with X-ray diffraction, X-ray photoemission spectroscopy, Rutherford back-scattering spectroscopy and vibrating sample magnetometer. The MR was measured using square-probe array method in the magnetic field of 0-1.5T. The films were polycrystalline with (1 0 0) and (1 1 0) orientations and showed pseudocubic perovskite structure. The maximum MR ratio of thin film with TS of 680°C is 0.62 under a relatively low field of 1.5 T. Moreover, it is important to notice that the MR ratio reached 0.3 near room temperature in thin films with TS of 600°C and 680°C.

Original languageEnglish
Pages (from-to)592-594
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume254-255
DOIs
Publication statusPublished - 2003 Jan 1
EventSMM15 - Bilbao, Spain
Duration: 2001 Sep 52001 Sep 7

Fingerprint

Galvanomagnetic effects
Perovskite
Thin films
Substrates
thin films
room temperature
Magnetometers
Photoelectron spectroscopy
X ray spectroscopy
Magnetron sputtering
Temperature
magnetometers
spectroscopy
Magnetic properties
magnetron sputtering
x rays
photoelectric emission
perovskite
Spectroscopy
Scattering

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Lee, Jong Cheol ; Ie, Sang Yub ; Park, Seung Iel ; Kim, Chul Sung ; Jeong, Kwangho. / Magnetotransport properties of perovskite La-Ba-Mn-O-deposited films on Si substrates. In: Journal of Magnetism and Magnetic Materials. 2003 ; Vol. 254-255. pp. 592-594.
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Magnetotransport properties of perovskite La-Ba-Mn-O-deposited films on Si substrates. / Lee, Jong Cheol; Ie, Sang Yub; Park, Seung Iel; Kim, Chul Sung; Jeong, Kwangho.

In: Journal of Magnetism and Magnetic Materials, Vol. 254-255, 01.01.2003, p. 592-594.

Research output: Contribution to journalConference article

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AU - Lee, Jong Cheol

AU - Ie, Sang Yub

AU - Park, Seung Iel

AU - Kim, Chul Sung

AU - Jeong, Kwangho

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N2 - To obtain high MR ratio near room temperature in thin films grown on Si substrate, La-Ba-Mn-O thin films were prepared with various substrate temperature (TS) from 600°C to 720°C by RF magnetron sputtering, and the structural and magnetotransport properties were studied. All films were annealed at 800°C for 30 min in ambient. The structures, magnetic properties and compositions of La-Ba-Mn-O thin films have been studied with X-ray diffraction, X-ray photoemission spectroscopy, Rutherford back-scattering spectroscopy and vibrating sample magnetometer. The MR was measured using square-probe array method in the magnetic field of 0-1.5T. The films were polycrystalline with (1 0 0) and (1 1 0) orientations and showed pseudocubic perovskite structure. The maximum MR ratio of thin film with TS of 680°C is 0.62 under a relatively low field of 1.5 T. Moreover, it is important to notice that the MR ratio reached 0.3 near room temperature in thin films with TS of 600°C and 680°C.

AB - To obtain high MR ratio near room temperature in thin films grown on Si substrate, La-Ba-Mn-O thin films were prepared with various substrate temperature (TS) from 600°C to 720°C by RF magnetron sputtering, and the structural and magnetotransport properties were studied. All films were annealed at 800°C for 30 min in ambient. The structures, magnetic properties and compositions of La-Ba-Mn-O thin films have been studied with X-ray diffraction, X-ray photoemission spectroscopy, Rutherford back-scattering spectroscopy and vibrating sample magnetometer. The MR was measured using square-probe array method in the magnetic field of 0-1.5T. The films were polycrystalline with (1 0 0) and (1 1 0) orientations and showed pseudocubic perovskite structure. The maximum MR ratio of thin film with TS of 680°C is 0.62 under a relatively low field of 1.5 T. Moreover, it is important to notice that the MR ratio reached 0.3 near room temperature in thin films with TS of 600°C and 680°C.

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